TEM, STEM-EDX and AFM morphology/thickness characterisation
Cu5BHT crystal domains · Single Crystal
Crystals deposited on copper grids for TEM and on 300 nm SiO2/Si for AFM; AFM contact and tapping modes reported.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM step height range | 20 nm to 82 nm | — | — | Caption Range | p008 / SI page 7 · Results and Discussion · Figure S4 |
| Cu:S atomic ratio by STEM-EDX | 0.8:1 | — | — | Text Approximate | p003 / article page 3 of 7 · Synthesis and Morphological Characterizations of Cu5BHT Crystals · Figure 1d |
| Cu5BHT crystal domain lateral size range | 200 nm to 1 um | — | — | Text Range | p003 / article page 3 of 7 · Synthesis and Morphological Characterizations of Cu5BHT Crystals · Figures 1b, S2 |
| as-synthesised film lateral size | ~50 cm2 | — | — | Text Approximate | p003 / article page 3 of 7 · Synthesis and Morphological Characterizations of Cu5BHT Crystals |
| crystal surface RMS roughness | about 0.5 nm | — | — | Caption Approximate | p008 / SI page 7 · Results and Discussion · Figure S4 |
| typical domain size stated in abstract/results | ~600 nm | — | — | Text Approximate | p002 / article page 2 of 7 · Introduction |
| typical thickness for 600 nm Cu5BHT crystal | ~80 nm | — | — | Text Approximate | p003 / article page 3 of 7 · Synthesis and Morphological Characterizations of Cu5BHT Crystals · Figure S4 |