Room-temperature out-of-plane XRD and Rietveld refinement
Cu-TCNQ/Cu-BPyDC heterostructured thin film · Thin Film
Out-of-plane XRD on pristine Cu-TCNQ, pristine Cu-BPyDC and heterostructured thin films.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu-BPyDC phase-I fraction from Rietveld refinement | 84.23% | 0.8423 fraction | — | Caption Exact Reported | 3 · Supplementary Fig. 2 caption · Supplementary Fig. 2 |
| Cu-BPyDC phase-II fraction from Rietveld refinement | 15.77% | 0.1577 fraction | — | Caption Exact Reported | 3 · Supplementary Fig. 2 caption · Supplementary Fig. 2 |
| Cu-BPyDC film thickness | approximately 400 nm | 0.4 um | — | Text Approximate | 8 · Methods/Fabrication of pristine Cu-BPyDC thin film |
| Cu-TCNQ film thickness | approximately 600 nm | 0.6 um | — | Text Approximate | 8 · Methods/Fabrication of pristine Cu-TCNQ thin film |