Measurement evidence
Metal-Organic Framework Photoconductivity via Time-Resolved Terahertz Spectroscopy · Pattengale B., Neu J., Ostresh S. et al. · Journal of the American Chemical Society · 2019 · 9793-9797
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Zn2TTFTB thin film on FTO · Thin Film
Zn2TTFTB thin film on FTO checked for crystallinity and thickness.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Thin-film crystallinity | pXRD pattern confirmed correct crystallinity of Zn2TTFTB thin film on FTO. | — | — | Caption Qualitative | S9 · Supplementary Figures · Figure S8b |
| Zn2TTFTB film thickness on FTO | 10 um | — | — | Caption Exact Reported | S9 · Supplementary Figures · Figure S8c |
As-prepared Zn2TTFTB tape-cell sample · Powder
Powder X-ray diffraction after TRTS beam exposure.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Phase stability after TRTS | Post-TRTS pXRD confirmed phase stability and retained crystallinity after beam exposure. | — | — | Caption Qualitative | S10 · Supplementary Figures · Figure S11 |
As-synthesised Zn2TTFTB powder · Powder
As-synthesised Zn2TTFTB compared with calculated single-crystal pattern (CSD 913459).
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Powder phase purity | pXRD confirmed phase-purity of crystalline Zn2TTFTB and matched calculated single-crystal reference. | — | — | Text Qualitative | p002 / 9794 · main text · Figure 1a |