SEM, TEM, STEM-EDX
Pristine conductive Ni-MOF black powder · Powder
SEM on Hitachi S-4800 at 20 kV; TEM on Hitachi H-8100 at 200 kV; EDX mapping of Ni, C and O.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX elemental distribution | Uniform distribution of Ni, C and O | — | — | Text Qualitative | main p.3, article p.5412 · Morphology · Fig. 1e |
| SEM nanosphere average diameter | about 400 nm | — | — | Text Approximate | main p.3, article p.5412 · Morphology · Fig. 1c |