Post-cycling SEM/TEM/SAED
Si@Cu3(HITP)2-5 electrode · Electrode
Pure Si and Si@Cu3(HITP)2-5 electrodes before and after 1000 cycles at 1C.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Si@Cu3(HITP)2-5 electrode thickness increase after 1000 cyclesMarked as a best value within this paper | 34.6% | — | — | Text Exact Reported | 12 · Results and discussion · Fig. 8g-h |
| Pure Si post-cycling crack width lower bound | 19-50 um | — | range 19-50 um | Text Range | 12 · Results and discussion · Fig. 8b |
| Pure Si electrode thickness increase after 1000 cycles | 153.6% | — | — | Text Exact Reported | 12 · Results and discussion · Fig. 8e-f |