Synchrotron grazing-incidence X-ray diffraction
Pt3(C12N6O6)2 MOF thin film on Si · Thin Film
2D GIXD spectrum of Pt3(C12N6O6)2 MOF thin film on Si.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| 2D sheet orientation | mainly face-on orientation; [100] in plane Qz~0 and [002] near meridian Qxy~0 | — | — | Qualitative Qualitative | p. 4 · 3.1 · Fig. 3a |