Microscopy Morphology — Overscreening-Driven Modulation of Ion Adsorption and Desorption in Conductive MOF Electrodes by Charging Rates

2 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ni3(HITP)2 c-MOF film on silicon wafer for SEM · Thin Film

Zeiss Gemini 300 SEM operated at 3 kV on VFT-transferred c-MOF film on silicon wafer.

Context: pristine Ni3(HITP)2 film
Measurement source: 2587 · Methods - Characterization of c-MOF Film · Figure S2a,b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Most c-MOF film particles smaller thanMarked as a best value within this paper	most particle sizes are smaller than 1 um	1000 nm	—	Caption Approximate	S3 · Supplementary Figure 2 caption · Figure S2b
Film uniformity	good uniformity / homogeneous morphology	—	—	Caption Qualitative	S3 · Supplementary Figure 2 caption · Figure S2a

Ni3(HITP)2 c-MOF TEM dispersion · Powder

FEI Tecnai G2 F20 TEM at 300 kV, point resolution 80 pm; particles dispersed in acetone on carbon-coated copper grid.

Context: pristine Ni3(HITP)2 particles
Measurement source: 2587 · Methods - Characterization of c-MOF Film · Figure S16a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Average c-MOF crystal rod diameterMarked as a best value within this paper	diameter of about 20 nm	—	—	Text Approximate	2588 · Methods - Linkage between Experiments and Simulations · Figure S16a
Average c-MOF crystal rod lengthMarked as a best value within this paper	average length of about 250 nm	—	—	Text Approximate	2588 · Methods - Linkage between Experiments and Simulations · Figure S16a