Measurement evidence
1D Conductive Metal-Organic Framework-Enabled Dual-Parameter MEMS Gas Sensor for Thermal Runaway Monitoring · Liu X., Wu J., Li J. et al. · Advanced Functional Materials · 2026 · e11152
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
In-situ grown CuBTA film on MEMS IDEs · Thin Film
Drop-cast and in-situ grown MBTA films on silicon wafer; numeric Table S4 values unavailable in provided SI text
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Electrical conductivity of CuBTA filmMarked as a best value within this paper | 9.81 x 10^-2 S/m | — | — | SI Table Exact Reported | SI p.31 · Supporting Tables · Table S4 |
CuBTA powder · Powder
Powder sample, 25 deg C
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Electrical conductivity | 4.66 x 10^-2 S/m | — | — | SI Table Exact Reported | SI p.31 · Supporting Tables · Table S4 |
In-situ grown NiBTA film on MEMS IDEs · Thin Film
Drop-cast and in-situ grown MBTA films on silicon wafer; numeric Table S4 values unavailable in provided SI text
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Electrical conductivity of NiBTA filmMarked as a best value within this paper | 8.82 x 10^-2 S/m | — | — | SI Table Exact Reported | SI p.31 · Supporting Tables · Table S4 |
NiBTA powder · Powder
Powder sample, 25 deg C
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Electrical conductivity | 3.71 x 10^-2 S/m | — | — | SI Table Exact Reported | SI p.31 · Supporting Tables · Table S4 |