Microscopy Morphology — Mithrene is a self-assembling robustly blue luminescent metal-organic chalcogenolate assembly for 2d optoelectronic applications

5 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

CTAB-modified Janus mithrene crystallites · Thin Film

Crystals grown with CTAB in the aqueous layer; compared with non-surfactant conditions.

Context: Surfactant-modified mithrene morphology.
Measurement source: main pp.4-5, article pp.3501-3502 · Role of Metal Ion Concentration on Crystal Morphology · Figures 6 and 7

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
CTAB-induced Janus morphology	CTAB-modified crystals showed one smooth side and one basal {001} plane decorated with crystallographically aligned mithrene pillars.	—	—	Text Qualitative	main p.4, article p.3501 · Role of Metal Ion Concentration on Crystal Morphology · Figure 6

Standard 3 mM/3 mM mithrene crystals harvested on silicon · Thin Film

EDS at 5-10 kV accelerating voltage.

Context: Pristine crystalline target.
Measurement source: main p.2, article p.3499 · Synthesis and Optoelectronic Uniformity

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Crystalline mithrene Ag:Se ratioMarked as a best value within this paper	1:1 silver-selenium ratio	—	—	Text Rounded Reported	main p.2, article p.3499 · Synthesis and Optoelectronic Uniformity of Mithrene

MOCP matrix co-evolved with mithrene · Thin Film

SI EDS table reports rounded atomic and weight concentrations; 5 kV electron accelerating voltage was suitable for determining atomic concentration.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
MOCP Ag:Se ratioMarked as a best value within this paper	2:1 silver-selenium ratio	—	—	Caption Rounded Reported	SI p.S-5 · Supporting Information · Figure S4
MOCP EDS atomic concentration silver	Silver atomic concentration 18%	—	rounded to nearest whole number	SI Table Rounded Reported	SI p.S-5 · Supporting Information · Figure S4 table
MOCP EDS atomic concentration selenium	Selenium atomic concentration 9%	—	rounded to nearest whole number	SI Table Rounded Reported	SI p.S-5 · Supporting Information · Figure S4 table

Mithrene concentration and growth-time screening samples · Thin Film

Samples organised by silver concentration on the y-axis and growth time on the x-axis; AgNO3 and DPSe screens over 0.5-10 mM and 3, 5, 10 days.

Context: Pristine mithrene plus co-evolved MOCP in some films.
Measurement source: main p.4, article p.3501 · Role of Metal Ion Concentration on Crystal Morphology · Figure 4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
DPSe concentration effect	Variation of diphenyl diselenide concentration weakly correlates to crystal thickness; no distinguishable crystal-habit changes except thickness variations in SI.	—	—	Text Qualitative	main p.4, article p.3501 · Role of Metal Ion Concentration on Crystal Morphology · Figure S5
High silver concentration morphology	Crystals formed at 5-10 mM silver nitrate showed branching growth from {100} and {010}, giving wing-like or lenticular appearance.	—	—	Text Range	main p.4, article p.3501 · Role of Metal Ion Concentration on Crystal Morphology · Figure 4
Low silver concentration morphology	At low concentrations of silver nitrate, platy crystal habits are favoured.	—	—	Text Qualitative	main p.4, article p.3501 · Role of Metal Ion Concentration on Crystal Morphology · Figure 4
MOCP abundance trend	Amorphous MOCP yield correlates with silver concentration, with MOCP dominating at higher silver concentration and longer growth times.	—	—	Text Qualitative	main p.4, article p.3501 · Role of Metal Ion Concentration on Crystal Morphology · Figure 5 and Figure S3

Standard 3 mM/3 mM mithrene crystals harvested on silicon · Thin Film

FEI Phenom ProX Tabletop SEM at 5 or 15 kV; Zeiss Gemini Ultra-55 FESEM at 1-3 kV for additional high-resolution images.

Context: Pristine crystalline mithrene target in sparse harvested films.
Measurement source: main pp.2 and 8, article pp.3499 and 3505 · Synthesis and Optoelectronic Uniformity; Characterization · Figure 2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Interlamellar spacing assigned from step edges	1.4 nm	—	—	Text Rounded Reported	main p.2, article p.3499 · Synthesis and Optoelectronic Uniformity of Mithrene · Figure 2e
Mithrene crystallite edge length range	1-4 um	—	—	Caption Range	main p.2, article p.3499 · Figure caption · Figure 2d
Representative mithrene crystallite thickness	about 100 nm	—	—	Caption Approximate	main p.2, article p.3499 · Figure caption · Figure 2d