Diffraction Structure — Preparation of hierarchical MOF-5 films using morphology controlled ZnO coatings for temperature dependent optical sensors application

Measurement evidence

Diffraction Structure

Preparation of hierarchical MOF-5 films using morphology controlled ZnO coatings for temperature dependent optical sensors application · Jamali S., Kazemzad M., Naderi N. et al. · Materials Chemistry and Physics · 2023 · 127775

2 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

XRD, Cu K-alpha radiation

X-ray diffraction and scattering

MOF-5/ZnO nanorod hybrid thin film · Thin Film

XRD phase assignment for MOF-5/ZnO hybrid film and Table 1 lattice parameters

Context: MOF-5/ZnO hybrid
Measurement source: 5 · Characterization · Fig. 3a, Table 1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
MOF-5 crystallite size range from Table 1	13.0-113.8 nm	—	—	Table Range	5 · Characterization · Table 1
MOF-5 lattice parameter	a = 0.255 nm	—	—	Text Exact Reported	5 · Characterization · Fig. 3a
MOF-5 (220) XRD peakMarked as a best value within this paper	2theta = 9.7894 deg	—	—	Table Exact Reported	5 · Characterization · Table 1
MOF-5 (400) XRD peakMarked as a best value within this paper	2theta = 14.2284 deg	—	—	Table Exact Reported	5 · Characterization · Table 1
MOF-5 XRD peak positions in Table 1	9.7894, 14.2284, 15.6713, 18.4729, 19.2562, 21.3284	—	—	Table Exact Reported	5 · Characterization · Table 1

XRD, Cu K-alpha radiation

X-ray diffraction and scattering

ZnO nanorod thin film · Thin Film

XRD from 10-60 deg, 40 keV, 30 mA

Context: ZnO component control
Measurement source: 2 · Apparatus

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ZnO crystallite size range from Table 1	18.7-91.8 nm	—	—	Table Range	5 · Characterization · Table 1
ZnO lattice parameter a=b	a = b = 0.3242 nm	—	—	Text Exact Reported	5 · Characterization
ZnO lattice parameter c	c = 0.5185 nm	—	—	Text Exact Reported	5 · Characterization
ZnO wurtzite XRD peak positions	31.8384, 34.5636, 36.3614, 47.6295, 56.7115, 63.0444	—	—	Table Exact Reported	5 · Characterization · Table 1