Powder X-ray diffraction (PXRD), Cu Kalpha radiation
A-Cu-HHTP nanosheet powder · Nanosheet
3-50 degrees 2theta, 40 kV, 40 mA; compared with simulated phase-1 stacking patterns.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| A-Cu-HHTP PXRD phase assignment | Highly crystalline Cu-HHTP; diffraction peaks highly consistent with phase-1/eclipsed stacking. | — | — | Text Qualitative | 3 · 3.1 · Figure 1 |