Grazing incidence X-ray diffraction
Ni3(HITP)2 thin film on indium tin oxide electrode · Electrode
Cu K alpha, grazing incidence angle 3.6 degrees, 10 min exposure; unmodified ITO and Ni3(HITP)2 film before/after ORR.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| long-range order after ORR | Retention of long-range order in the ab plane during ORR. | — | — | Text Qualitative | main p.3 · Characterization before and after ORR · Supplementary Fig. 11 |