cMOF Evidence Base
Microscopy Morphology — Single Crystals of Electrically Conductive Two-Dimensional Metal-Organic Frameworks: Structural and Electrical Transport Properties

Measurement evidence

Microscopy Morphology

Single Crystals of Electrically Conductive Two-Dimensional Metal-Organic Frameworks: Structural and Electrical Transport Properties · Day R.W., Bediako D.K., Rezaee M. et al. · ACS Central Science · 2019 · 1959-1964

2 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, AFM and TEM imaging of exfoliated flakes.

Scanning electron microscopyTransmission electron microscopyAtomic force microscopy

Exfoliated Cu3(HHTP)2 flakes · Nanosheet

Flakes obtained from solvent sonication were examined by SEM, 2D AFM/height profile, optical microscopy and TEM.

Context
Pristine exfoliated Cu3(HHTP)2 flakes.
Measurement source
SI p.10 · Supplementary Figure 6 · SI Figure 6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3(HHTP)2 exfoliated flake height upper endHeights of ~50-500 nm.——Text
Approximate		main p.3, article p.1961 · Results and Discussion · SI Figure 6
Cu3(HHTP)2 exfoliated flake height lower endHeights of ~50-500 nm.——Text
Approximate		main p.3, article p.1961 · Results and Discussion · SI Figure 6
Cu3(HHTP)2 exfoliated flake lateral widthWidths of ~1 um.——Text
Approximate		main p.3, article p.1961 · Results and Discussion · SI Figure 6

Low-dose HRTEM with FFT and intensity-profile analysis; supporting PXRD.

X-ray diffraction and scatteringTransmission electron microscopy

Isolated Ni3(HITP)2 rods · Single Crystal

TEM grids prepared by drop-casting 3.5 uL sample onto Cu-mesh lacey-C substrates; JEOL GrandARM 300 operated at 300 keV.

Atmosphere
Ambient grid preparation; desiccator storage before TEM.
Context
Pristine isolated Ni3(HITP)2 rods.
Measurement source
SI p.3 and p.12-13 · TEM; Supplementary Figures 8 and 9 · Main Figure 4a; SI Figures 8 and 9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Schematic pore diameter for conductive 2D MOF layersPores approximately 2 nm in diameter.——Caption
Approximate		main p.2, article p.1960 · Figure 1 caption · Figure 1
Ni3(HITP)2 FFT periodicity0.6 nm fringe periodicity——Text
Rounded Reported		main p.3, article p.1961 · Results and Discussion · Figure 4a
Ni3(HITP)2 FFT periodicity0.9 nm fringe periodicity——Text
Rounded Reported		main p.3, article p.1961 · Results and Discussion · Figure 4a
Ni3(HITP)2 FFT periodicity1.8 nm fringe periodicity——Text
Rounded Reported		main p.3, article p.1961 · Results and Discussion · Figure 4a
Ni3(HITP)2 additional periodic feature spacing0.33 nm spacing——Text
Rounded Reported		main p.3, article p.1961 · Results and Discussion · Figure 4a
Ni3(HITP)2 isolated rod diameterRods about ~200 nm in diameter.——Text
Approximate		main p.2, article p.1960 · Results and Discussion · Figure 2a; SI Figure 1
Ni3(HITP)2 isolated rod maximum lengthRods up to ~2 um in length.——Text
Approximate		main p.2, article p.1960 · Results and Discussion · Figure 2a; SI Figure 1