Sun L., Park S.S., Sheberla D. et al. · Journal of the American Chemical Society · 2016 · 14772-14782
Open a family to keep every result attached to its sample, method and conditions.
Paraphrased for this database from the authors’ stated interpretations — never quoted verbatim — and kept separate from reported measurements.
A reporting checklist is proposed for conductive MOF electrical measurements, including sample morphology, direction, pressing pressure, batches, device method, device fabrication details, environmental conditions and calculations.
Caveat: Guideline claim, not a numerical result.
p010 / 14781 · Conclusions
Bottom-contact, top-contact and alloy-contact approaches were not reliable for Cd2(TTFTB) under the tested conditions.
Caveat: Authors note these methods may be useful for other materials with different anisotropy/mechanics/wetting.
S13-S15 · Device approaches · Figures S14-S17 · Linked to 3 structured results
Temperature, atmosphere and illumination measurably alter Cd2(TTFTB) conductivity and must be controlled/reported.
Caveat: Illumination response may contain thermal and optical contributions.
p010 / 14781 · Conclusions · Linked to 5 structured results
Four-probe methods are preferred when contact resistance matters, but two-contact methods are sufficiently accurate for samples with resistance above about 1 kOhm.
Caveat: Two-contact methods underestimate conductivity for very conductive samples.
p010 / 14781 · Conclusions · Linked to 4 structured results
Pressed-pellet conductivity is a weighted average of crystallographic directions and can underestimate the highest single-crystal conductivity.
Caveat: Pellet grain boundaries, crystallite orientation, and cracks/delamination can affect values.
p008 / 14779 · Comparison and discussion · Figure 7 · Linked to 6 structured results
Charge transport is anisotropic; sigma_parallel_c is 2-3 orders of magnitude higher than sigma_perpendicular_c because TTF stacks run along the c axis.
Caveat: Single-crystal device quality varies, so averages over multiple crystals are preferred.
p008 / 14779 · Comparison and discussion · Figure 7 · Linked to 3 structured results
Names and aliases are kept exactly within the paper’s own identity model.
| Material | Composition | Structure context | Source |
|---|---|---|---|
| Cd2(TTFTB)Browse family: Cd₂(TTFTB) | Cd2(TTFTB)cadmium-carboxylate chains · TTFTB4- = tetrathiafulvalene tetrabenzoate / tetrathiafulvalene tetracarboxylate | 3D · PristineAnisotropic semiconducting MOF; TTF moieties form one-dimensional helical pi-stacks parallel to crystallographic c axis. | p001-002 / 14772-14773 · Introduction · Figure 1 |
Sample form, processing state and composition status define the context for measurements.
| Sample | Form and role | Processing and geometry | Source |
|---|---|---|---|
| Cd2(TTFTB) crystallites / as-synthesised crystalsresearch_0010__mat__cd2_ttf_tb | Powder · Target Sample · Pristine Framework | Prepared according to prior literature; used as source crystallites for pellets and single crystals.none | S1 · Materials |
| Pressed pellet, direct-contact proberesearch_0010__mat__cd2_ttf_tb | Pellet · Target Sample · Pristine Framework | Hydraulically pressed at approximately 1 GPa for 5 min; contacted directly by gold-plated tungsten probes.dry glass slide on probe-station chuck · 240 um; pellet diameter 6.0 mm | S6 · 4-point probe method for pressed pellets · Figure 3c,d; Figure S7 |
| Pressed pellet, in situ pressresearch_0010__mat__cd2_ttf_tb | Pellet · Target Sample · Pristine Framework | Crystallites pressed at approximately 200 MPa in a home-built in situ press; carbon-coated aluminium foil optionally used for contact.glass tube / stainless steel rods · 170-820 um; pellet diameter 0.208 cm | S2 · 2-contact probe method for pressed pellets by in situ press · Figure 3f; Figure S4 |
| Pressed pellet, wire-paste cuboidresearch_0010__mat__cd2_ttf_tb | Pellet · Target Sample · Pristine Framework | Hydraulically pressed at approximately 1 GPa for 5 min, cut into a cuboid, contacted with gold wire and carbon paste.dry glass slide · 212 um; approximate cuboid 3 mm x 2 mm x 0.212 mm | S3 · 2-contact probe method for pressed pellets by pasting wires · Scheme S1 |
| Single-crystal alloy-contact devicesresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Ga-Sn or In-Ga-Sn alloy drops on tungsten probe tips contacted the crystal.sapphire · 800 um-long crystal | S15 · Alloy approach for single crystals · Figure S17 |
| Single-crystal bottom-contact devicesresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Single crystals transferred onto prepatterned Ti/Au four-contact electrodes.Si wafer with 300 nm thermal oxide, Ti/Au electrodes · conduction channel length 20 um; Table S2 entries 42-44 | S12-S13 · Bottom-contact approach for single crystals · Figure S14; Figure S15; Table S2 |
| Single-crystal wire-paste devices for environmental testsresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Two-contact wire-paste devices used for illumination, atmosphere, and temperature tests.glass slide on Janis ST-500 probe station chuck · length and hexagonal edge measured optically | S16 · Influence of environmental conditions · Figures 8-10; Figure S18 |
| Single-crystal probe-paste devices, sigma_parallel_cresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Micromanipulated tungsten probes coated with carbon paste contacted the two hexagonal faces.air during final contact geometry · crystals as small as 40 um; Table S2 entries 27-31 | S9-S10 · Probe-paste approach for single crystals · Figure 5a,c; Figure S10 |
| Single-crystal probe-paste devices, sigma_perpendicular_cresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Micromanipulated carbon-paste-coated probes contacted opposite rectangular faces.air during final contact geometry · hexagonal edge as small as 10 um; Table S2 entries 32-36 | S9-S10 · Probe-paste approach for single crystals · Figure 5b,d; Figure S11 |
| Single-crystal probe-wire-paste devicesresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Gold wires attached to micromanipulated tungsten probes and contacted crystal faces with carbon paste.dry glass slide · crystals as small as 100 um; Table S2 entries 37-41 | S11 · Probe-wire-paste approach for single crystals · Figure 6; Figure S12 |
| Single-crystal top-contact devicesresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Shadow-mask top contacts deposited as 3 nm Ti / 300 nm Au by e-beam evaporation.dry glass slide with evaporated Ti/Au through shadow mask · crystals as small as 200 um | S14 · Top-contact method for single crystals · Figure S16 |
| Single-crystal wire-paste devicesresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Two or four gold wires manually attached with carbon paste; conductivity measured parallel to c axis.dry glass slide · crystal dimensions measured optically; Table S2 entries 1-26 | S8 · Wire-paste approach for single crystals · Figure 4; Figures S8-S9; Table S2 |
| Cd2(TTFTB) single crystalsresearch_0010__mat__cd2_ttf_tb | Single Crystal · Target Sample · Pristine Framework | Uniform hexagonal rod single crystals selected by optical microscopy/polarised filters.various device substrates · typically rod-like; at least 100 um long in this study | p002 / 14773 · Introduction · Figure 1; Figure S1 |