cMOF Evidence Base
Diffraction Structure — Copper-based conductive metal organic framework in-situ grown on copper foam as a bifunctional electrocatalyst

Measurement evidence

Diffraction Structure

Copper-based conductive metal organic framework in-situ grown on copper foam as a bifunctional electrocatalyst · Zhang C., Chen Z., Lian Y. et al. · Wuli Huaxue Xuebao/ Acta Physico - Chimica Sinica · 2019 · 1404-1411

2 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

post-OER/ORR XRD and SEM

X-ray diffraction and scatteringScanning electron microscopy

Cu3HITP2/CF · Electrode

XRD and SEM after OER and ORR used to assess phase/morphology stability.

Atmosphere
alkaline electrochemical conditions
Geometry
Cu3HITP2/CF electrode
Context
target composite sample after catalysis
Measurement source
s3 · SI · Fig. S5, Fig. S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3HITP2 phase stability after OER/ORRXRD remained essentially unchanged before and after OER/ORR——Text
Qualitative		1408, 1410 · 3.2-3.3 · Fig. S5

powder X-ray diffraction

X-ray diffraction and scattering

powder/delaminated Cu3HITP2 · Powder

Bruker D8 Advance XRD; wavelength 0.154056 nm; 60 kV; 4-30 deg 2theta; scan rate 0.5 deg s-1.

Atmosphere
ambient
Geometry
powder/removed sample
Context
pristine framework
Measurement source
1406-1407 · 2.1; 3.1 · Fig. 2a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3HITP2 XRD (001) peak2theta = 27.0 deg——Text
Rounded Reported		1407 · 3.1 · Fig. 2a
Cu3HITP2 XRD (100) peak2theta = 4.8 deg——Text
Rounded Reported		1407 · 3.1 · Fig. 2a
Cu3HITP2 XRD (200) peak2theta = 9.7 deg——Text
Rounded Reported		1407 · 3.1 · Fig. 2a