SEM, TEM and EDX mapping
Cu3HITP2/CF · Electrode
SEM on FEI Scios at 20 kV; TEM on FEI TECNAI G2 F20 at 200 kV; EDX elemental mapping for Cu, N and C.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu3HITP2/CF morphology | nanosheet layer on Cu(OH)2-derived nanowires; Cu, N and C uniformly distributed | — | — | Text Qualitative | 1408 · 3.1 · Fig. 4, Fig. S2-S4 |