Microscopy Morphology — Ultrathin two-dimensional conjugated metal-organic framework single-crystalline nanosheets enabled by surfactant-assisted synthesis

5 measurement groups · 16 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

HHB-Cu nanosheets · Nanosheet

AFM on 300 nm SiO2/Si substrate; thickness and lateral-size statistics.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HHB-Cu NS lateral sizeMarked as a best value within this paper	0.30-0.65 um2	—	range	SI Table Range	SI p.33 · Table S1 · Table S1
AFM arithmetic average roughness	Ra about 0.23 nm	—	—	Text Approximate	main p.3 · Results and discussion · Fig. 2A
HHB-Cu NS thicknessMarked as a best value within this paper	4.2 +/- 1.1 nm	—	+/- 1.1 nm	SI Table Exact Reported	SI p.33 · Table S1 · Table S1
HHB-Cu NS synthesis yieldMarked as a best value within this paper	87.5%	—	—	SI Table Exact Reported	SI p.33 · Table S1 · Table S1

HHB-Ni nanosheets · Nanosheet

Structural and morphological characterisation of SDS-assisted HHB-Ni nanosheets.

Context: pristine nanosheet framework
Measurement source: main p.4 · Results and discussion · Fig. 1C; Fig. S13; Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HHB-Ni NS lateral sizeMarked as a best value within this paper	0.25-0.56 um2	—	range	SI Table Range	SI p.33 · Table S1 · Table S1
HHB-Ni NS thicknessMarked as a best value within this paper	4.5 +/- 1.4 nm	—	+/- 1.4 nm	SI Table Exact Reported	SI p.33 · Table S1 · Table S1
HHB-Ni NS synthesis yieldMarked as a best value within this paper	85.5%	—	—	SI Table Exact Reported	SI p.33 · Table S1 · Table S1

bulk HHTP-Cu rod-like powder · Powder

Surfactant-free bulk HHTP-Cu powder imaged to show rod-like morphology and layered stacking.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HHTP-Cu bulk rod lattice distance	1.8 nm	—	—	Caption Exact Reported	SI p.20 · Figure S14 caption · Fig. S14H
HHTP-Cu bulk rod pi-pi stacking distance	0.33 nm	—	—	Caption Exact Reported	SI p.20 · Figure S14 caption · Fig. S14H

HHTP-Cu nanosheets · Nanosheet

Structural and morphological characterisation of SDS-assisted HHTP-Cu nanosheets.

Context: pristine nanosheet framework
Measurement source: main p.4 · Results and discussion · Fig. 1E-F; Fig. S14; Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HHTP-Cu NS lateral sizeMarked as a best value within this paper	0.002-0.02 um2	—	range	SI Table Range	SI p.33 · Table S1 · Table S1
HHTP-Cu NS thicknessMarked as a best value within this paper	5.1 +/- 2.6 nm	—	+/- 2.6 nm	SI Table Exact Reported	SI p.33 · Table S1 · Table S1
HHTP-Cu NS synthesis yieldMarked as a best value within this paper	80.5%	—	—	SI Table Exact Reported	SI p.33 · Table S1 · Table S1

HHB-Cu nanosheets · Nanosheet

TEM/SAED on copper grids; AC-HRTEM on FEI Titan 80-300 at 300 kV.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AC-HRTEM image resolution	0.22 nm	—	—	Caption Exact Reported	main p.3 · Figure 2 caption · Fig. 2D
Measured pore size from AC-HRTEM	1.2 nm	—	—	Text Rounded Reported	main p.4 · Results and discussion · Fig. 2E
SAED-derived hexagonal unit-cell side length	1.24 nm	—	—	Text Exact Reported	main p.4 · Results and discussion · Fig. 2C
First-order SAED reflection	0.93 nm^-1	—	—	Text Rounded Reported	main p.4 · Results and discussion · Fig. 2C