Spectroscopy — Ultrathin two-dimensional conjugated metal-organic framework single-crystalline nanosheets enabled by surfactant-assisted synthesis

4 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

HHB-Cu nanosheets · Nanosheet

EDX used for elemental mapping; XPS calibrated to graphitic C1s 284.6 eV.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu2+/Cu+ ratio	about 9.44	—	—	Text Approximate	main p.4 · Results and discussion · Fig. S5
EDX Cu:O ratio	Cu:O = 1.2:4	—	—	Text Exact Reported	main p.3 · Results and discussion · Fig. S3-S4
XPS Cu 2p3/2 peak	933 eV	—	—	Text Rounded Reported	main p.3 · Results and discussion · Fig. S5
XPS Cu:O ratio	Cu:O = 1.1:4	—	—	Text Exact Reported	main p.3 · Results and discussion · Fig. S5

HHB-Cu NS organic cathode electrode · Electrode

Pristine, charged and discharged HHB-Cu NS electrode states examined to support redox mechanism.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
C=C FT-IR peak disappearance on discharge	C=C peak at ~1515 cm^-1 disappeared in discharged state	—	—	Text Approximate	main p.6 · Results and discussion · Fig. S25
Reversible C-O FT-IR peak change	C-O peak at ~1068 cm^-1 reversibly changes	—	—	Text Approximate	main p.6 · Results and discussion · Fig. S25

HHB-Cu nanosheets · Nanosheet

Raman at ambient conditions; UV/vis on HHB-Cu NSs dispersed on a quartz substrate at room temperature.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Optical absorption edge / Tauc gap	~1.7 eV	—	—	Text Approximate	main p.4 · Results and discussion · Fig. S8
Raman C=O peak eliminated	C=O peak at 1649 cm^-1 eliminated	—	—	Text Rounded Reported	main p.4 · Results and discussion · Fig. S7
Raman OH peak eliminated	OH peak at 3370 cm^-1 eliminated	—	—	Text Rounded Reported	main p.4 · Results and discussion · Fig. S7

HHB-Cu nanosheets · Nanosheet

Room-temperature transmission-mode XAS at SSRF beamlines BL14W1 and BL15U1.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EXAFS Cu-O contribution distance	~1.52 Angstrom	0.152 nm	—	Text Approximate	main p.4 · Results and discussion · Fig. S6B