Electrical Transport — Highly Electroconductive Metal-Organic Framework: Tunable by Metal Ion Sorption Quantity

5 measurement groups · 17 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cd(II)-exposed TMU-60/PVDF paste electrode · Electrode

Current plotted against inverse square root of time for reduction potential; used to calculate apparent charge diffusion coefficient.

Geometry: TMU-60-Cd electrode
Context: charge transport mechanism in TMU-60-Cd
Measurement source: 7 · Investigation of Charge-Transfer Mechanism · Figure S9

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
apparent charge diffusion coefficient Dhopping	1.6 x 10^-10 cm2/s	1.6e-14 m^2/s	—	Text Exact Reported	7 · Investigation of Charge-Transfer Mechanism · Figure S9
average metal-metal hopping distance	2.96 nm	2.96e-9 m	—	Text Exact Reported	7 · Investigation of Charge-Transfer Mechanism
microscopic hopping rate constant	1827 s^-1	—	—	Text Exact Reported	7 · Investigation of Charge-Transfer Mechanism

Cd(II)-exposed TMU-60/PVDF paste electrode · Electrode

TMU-60 paste electrode immersed in 50 ppm Cd(II) aqueous solution for 0, 2, 5, 10, 15, and 20 min; fitted with ZView equivalent circuits.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
charge transfer resistance at 0 min	56500 ohm	—	—	SI Table Exact Reported	S-7 · Table S6
charge transfer resistance at 10 min	550 ohm	—	—	SI Table Exact Reported	S-7 · Table S6
charge transfer resistance at 15 min	495 ohm	—	—	SI Table Exact Reported	S-7 · Table S6
charge transfer resistance at 20 minMarked as a best value within this paper	~0 ohm	—	~	SI Table Approximate	S-7 · Table S6
charge transfer resistance at 2 min	23600 ohm	—	—	SI Table Exact Reported	S-7 · Table S6
charge transfer resistance at 5 min	622 ohm	—	—	SI Table Exact Reported	S-7 · Table S6
MOF resistance RM stability	RM remains almost unchanged, 221 to 206 ohm over 0-20 min	—	—	SI Table Exact Reported	S-7 · Table S6

TMU-60-Cd compressed pellet · Pellet

Cd2+-adsorbed dry pressed pellet, room temperature; 1 cm diameter, 0.2 mm thickness.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
conductivity enhancement factor Cd-loaded versus pristine	calculated from 1.8 x 10^-2 / 53 x 10^-6 = about 340	—	—	Calculated From Reported Approximate	1 · Abstract
room-temperature conductivity of TMU-60-Cd pelletMarked as a best value within this paper	1.8 x 10^-2 S/cm	1.8 S/m	—	Text Exact Reported	7 · Direct Current I-V Measurement · Figure 9

pristine TMU-60 compressed pellet · Pellet

Dry pressed pellet, room temperature; 1 cm diameter, 0.2 mm thickness; straight-line probe geometry.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
room-temperature conductivity of pristine TMU-60 pellet	53 x 10^-6 S/cm	0.0053 S/m	—	Text Exact Reported	7 · Direct Current I-V Measurement · Figure 9

TMU-60 exposed to Zn(II), Co(II), Cu(II), or Pb(II) · Pellet

TMU-60 exposed to Zn(II), Co(II), Cu(II), or Pb(II), then measured by four-point probe.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
conductivity after Co(II) exposure	1.2 x 10^-6 S/cm	0.00012 S/m	—	SI Table Exact Reported	S-7 · Table S5
conductivity after Cu(II) exposure	1.25 x 10^-6 S/cm	0.000125 S/m	—	SI Table Exact Reported	S-7 · Table S5
conductivity after Pb(II) exposure	1.4 x 10^-6 S/cm	0.00014 S/m	—	SI Table Exact Reported	S-7 · Table S5
conductivity after Zn(II) exposure	1.2 x 10^-6 S/cm	0.00012 S/m	—	SI Table Exact Reported	S-7 · Table S5