SEM and EDX
VPI xTCNQ@Cu3BTC2 concentration series · Powder
Top-view micrographs of MOF powders on Merlin high-resolution SEM at 5 kV; transfer under argon; 5 nm Pt coating; EDX at 5 kV.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu(TCNQ) nanowire amount versus loading | amount and dimensions increase with TCNQ loading | — | — | Caption Qualitative | 7408 · Results · Figure 4 |