cMOF Evidence Base
Diffraction Structure — Tunable electrical conductivity in metal-organic framework thin-film devices

Measurement evidence

Diffraction Structure

Tunable electrical conductivity in metal-organic framework thin-film devices · Talin A.A., Centrone A., Ford A.C. et al. · Science · 2014 · 66-69

1 measurement group · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder XRD and grazing-incidence XRD; Rietveld refinement

X-ray diffraction and scattering

TCNQ@Cu3(BTC)2 powder · Powder

As-synthesised hydrated, activated, and TCNQ-infiltrated Cu3(BTC)2 powders and thin film

Context
target compared with pristine controls
Measurement source
2 · main text · Fig. 1C; Fig. S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Diagnostic guest-binding XRD peak2theta = 5.759 degrees——Text
Exact Reported		2 · main text · Fig. 1C
Cu3(BTC)2 lattice parameter2.617 +/- 0.001 nm—+/- 0.001 nmText
Exact Reported		2 · main text · Fig. 1C
TCNQ@Cu3(BTC)2 lattice parameter2.635 +/- 0.001 nm—+/- 0.001 nmText
Exact Reported		2 · main text · Fig. 1C; Fig. S2