cMOF Evidence Base
Microscopy Morphology — Tunable electrical conductivity in metal-organic framework thin-film devices

Measurement evidence

Microscopy Morphology

Tunable electrical conductivity in metal-organic framework thin-film devices · Talin A.A., Centrone A., Ford A.C. et al. · Science · 2014 · 66-69

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Scanning electron microscopy and optical imaging

Scanning electron microscopy

As-grown Cu3(BTC)2.xH2O thin-film device on Pt/SiO2 · Thin Film

MOF-coated device before and after TCNQ infiltration

Geometry
thin-film device
Context
device morphology and colour change
Measurement source
1 · figure caption · Fig. 1B
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Film morphology/structure from SEM and XRDpolycrystalline Cu3(BTC)2.xH2O film with preferred (111) orientation——Text
Qualitative		1 · main text · Fig. 1B-C