SEM and EDS mapping
Co/Ni-HHTP@CP electrode · Electrode
SEM/EDS used to inspect c-MOF growth on activated carbon paper and compare Co/Ni-, Co/Cu-, and Cu/Ni-HHTP@CP.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Co content in Co/Cu-HHTP@CP | Co:3.66wt% | — | — | Caption Exact Reported | Figure captions · Figure S4a |
| Cu content in Co/Cu-HHTP@CP | Cu:9.50wt% | — | — | Caption Exact Reported | Figure captions · Figure S4a |
| Co content in Co/Ni-HHTP@CP | Co:20.56 wt% | — | — | Caption Exact Reported | 3 · Figure caption · Figure 1f |
| Ni content in Co/Ni-HHTP@CP | Ni:32.94 wt% | — | — | Caption Exact Reported | 3 · Figure caption · Figure 1f |
| Cu content in Cu/Ni-HHTP@CP | Cu:20.47wt% | — | — | Caption Exact Reported | Figure captions · Figure S4b |
| Ni content in Cu/Ni-HHTP@CP | Ni:6.39wt% | — | — | Caption Exact Reported | Figure captions · Figure S4b |