Microscopy Morphology — Integration of a (–Cu–S–) n plane in a metal–organic framework affords high electrical conductivity

Measurement evidence

Microscopy Morphology

Integration of a (–Cu–S–) n plane in a metal–organic framework affords high electrical conductivity · Pathak A., Shen J.-W., Usman M. et al. · Nature Communications · 2019 · 1721

1 measurement group · 0 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Optical microscopy and scanning electron microscopy

Scanning electron microscopy

As-synthesised brown rod-shaped crystals of compound 1 · Single Crystal

Bright-field/dark-field optical images and SEM of rod-shaped crystals.

Context: pristine
Measurement source: 2 · Synthesis · Fig. 2a; Supplementary Figs. 1-2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source