Diffraction Structure — Layer-by-Layer Assembled Conductive Metal–Organic Framework Nanofilms for Room-Temperature Chemiresistive Sensing

Measurement evidence

Diffraction Structure

Layer-by-Layer Assembled Conductive Metal–Organic Framework Nanofilms for Room-Temperature Chemiresistive Sensing · Yao M.-S., Lv X.-J., Fu Z.-H. et al. · Angewandte Chemie - International Edition · 2017 · 16510-16514

2 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Crystal-structure assignment from literature/simulated structure, PXRD comparison and SAED.

Cu3(HHTP)2-xC layer-by-layer thin-film series · Thin Film

Cu3(HHTP)2 framework structure discussed for thin films; PXRD of Cu3(HHTP)2-50C compared with simulated pattern.

Context
Pristine framework thin films.
Measurement source
main p.1-p.2, article p.16510-p.16511 · Structure and Figure 2 discussion · Figures 1-2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Thin-film preferred orientationc-axis orientation structure featureQualitative
Qualitative
main p.2, article p.16511 · TEM/SAED discussion · Figure 2i
Single-crystal domain size in thin filmup to hundreds nmlower-order descriptor only: hundreds of nmText
Approximate
main p.2, article p.16511 · TEM/SAED discussion · Figure 2g-h
Slipped-parallel AB interlayer distance3.3 AText
Rounded Reported
main p.1, article p.16510 · Crystal structure · Figure 1
Hexagonal lattice a and b parametersa = b = 21.75 AText
Exact Reported
main p.2, article p.16511 · TEM/SAED discussion · Figure 2g-h
Hexagonal lattice c parameterc = 6.66 AText
Exact Reported
main p.2, article p.16511 · TEM/SAED discussion · Figure 2g-h
One-dimensional channel open-window sizeabout 1.8 nmText
Approximate
main p.1, article p.16510 · Crystal structure · Figure 1
PXRD phase match for Cu3(HHTP)2-50Cmatches simulated Cu3(HHTP)2 patternQualitative
Qualitative
main p.2, article p.16511 · PXRD discussion · Figure 2f

SEM and PXRD before and after NH3 contact.

Cu3(HHTP)2 powder · Powder

Cu3(HHTP)2 powders compared before and after contact with NH3.

Atmosphere
NH3 exposure for after-contact sample.
Context
Pristine powder and NH3-exposed powder control.
Measurement source
SI p.11 · Figure S8 caption · Figure S8
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD stability after NH3 exposurecrystal structure remains unchanged before and after saturated NH3 exposureQualitative
Qualitative
main p.3, article p.16512 · Gas-sensing mechanism · Figure S7b / Figure S8