Microscopy Morphology — Layer-by-Layer Assembled Conductive Metal–Organic Framework Nanofilms for Room-Temperature Chemiresistive Sensing

Measurement evidence

Microscopy Morphology

Layer-by-Layer Assembled Conductive Metal–Organic Framework Nanofilms for Room-Temperature Chemiresistive Sensing · Yao M.-S., Lv X.-J., Fu Z.-H. et al. · Angewandte Chemie - International Edition · 2017 · 16510-16514

1 measurement group · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, AFM, UV/Vis, TEM and SAED.

UV-visible and optical absorption spectroscopy Scanning electron microscopy Transmission electron microscopy Atomic force microscopy

Cu3(HHTP)2-xC layer-by-layer thin-film series · Thin Film

Cycle-dependent film morphology and thickness characterised for Cu3(HHTP)2-xC.

Context: Pristine framework thin films.
Measurement source: main p.2, article p.16511 · Figure 2 discussion · Figure 2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Maximum RMS roughness for 100 nm film	less than 5 nm for the thin film with 100 nm thickness	—	upper bound	Text Range	main p.2, article p.16511 · AFM roughness discussion · Figure 2d
Cu3(HHTP)2-10C film thickness	about 20 nm	—	—	Text Approximate	main p.2, article p.16511 · TEM/SAED discussion · Figure 2g
Cu3(HHTP)2-50C film thickness	about 100 nm	—	—	Text Approximate	main p.2, article p.16511 · TEM/SAED discussion · Figure 2h
Film thickness increment per growth cycle	average 2 nm increment in thickness for each growing cycle	—	—	Text Rounded Reported	main p.2, article p.16511 · Thickness control · Figure 2c
UV/Vis absorbance growth trend	absorbance at 366 nm linearly proportional to growing cycles	—	—	Text Qualitative	main p.2, article p.16511 · UV/Vis growth monitoring · Figure 2e