cMOF Evidence Base
Diffraction Structure — Electronic Doping of Metal-Organic Frameworks for High-Performance Flexible Micro-Supercapacitors

Measurement evidence

Diffraction Structure

Electronic Doping of Metal-Organic Frameworks for High-Performance Flexible Micro-Supercapacitors · He Y., Yang S., Fu Y. et al. · Small Structures · 2021 · 2000095

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

XRD

X-ray diffraction and scattering

TCNQ@Cu3(BTC)2 thin film on Cu foil · Thin Film

XRD patterns of Cu3(BTC)2, TCNQ@Cu3(BTC)2, BQ@Cu3(BTC)2 and PMDI@Cu3(BTC)2 thin films on Cu foils; Rigaku D/max-2200/PC, Cu-Kalpha radiation (lambda 0.15418 nm), 40 kV, 5-30 degrees, 1 degree min^-1.

Context
doped films compared with pristine Cu3(BTC)2
Measurement source
3 · Results and Discussion · Figure 2d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
doped-film (333) peak shift(333) peak shifted to lower degree versus undoped film——Text
Qualitative		3 · Results and Discussion · Figure 2d
polycrystalline Cu3(BTC)2 assignmentpolycrystalline structure of doped Cu3(BTC)2 in thin films——Text
Qualitative		3 · Results and Discussion · Figure 2d