Powder X-ray diffraction; Bruker D8; Ni-filtered Cu Kalpha radiation
La1.5HOTP single crystal for diffraction/refinement · Single Crystal
Thin layer of material on zero-background silicon crystal plate
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PXRD phase purity | excellent crystallinity and overall phase purity; weak impurity peaks sometimes at 4.6 deg 2theta | — | — | Text Qualitative | p003 · Fig. S2 |