thin-film X-ray diffraction
Zn(NDI) thin film on FTO · Thin Film
Experimental thin-film XRD compared with simulated powder XRD; preferred orientation assessed.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| NDI linker head-to-head distance | 14.8 Å | — | — | Caption Exact Reported | 12001 · Figure 1a |
| crystallinity / preferred orientation | good crystallinity; c-axis parallel to FTO | — | — | Text Qualitative | 12001-12002 · Figure 1c; Figure S9 |