Diffraction Structure — Diffusional Electron Transport Coupled to Thermodynamically Driven Electron Transfers in Redox-Conductive Multivariate Metal-Organic Frameworks

Measurement evidence

Diffraction Structure

Diffusional Electron Transport Coupled to Thermodynamically Driven Electron Transfers in Redox-Conductive Multivariate Metal-Organic Frameworks · Li J., Kumar A., Ott S. · Journal of the American Chemical Society · 2024 · 12000-12010

5 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

thin-film X-ray diffraction

Zn(NDI) thin film on FTO · Thin Film

Experimental thin-film XRD compared with simulated powder XRD; preferred orientation assessed.

Context
pristine framework thin film on FTO
Measurement source
12001-12002 · Figure 1c; Figure S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
NDI linker head-to-head distance14.8 ÅCaption
Exact Reported
12001 · Figure 1a
crystallinity / preferred orientationgood crystallinity; c-axis parallel to FTOText
Qualitative
12001-12002 · Figure 1c; Figure S9

thin-film X-ray diffraction

Zn(NDI)0.2(PMDI)0.8 thin film on FTO · Thin Film

Experimental thin-film XRD compared with simulated powder XRD; preferred orientation assessed.

Context
pristine framework thin film on FTO
Measurement source
12001-12002 · Figure 1c; Figure S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
crystallinity / preferred orientationgood crystallinity; c-axis parallel to FTOText
Qualitative
12001-12002 · Figure 1c; Figure S9

thin-film X-ray diffraction

Zn(NDI)0.5(PMDI)0.5 thin film on FTO · Thin Film

Experimental thin-film XRD compared with simulated powder XRD; preferred orientation assessed.

Context
pristine framework thin film on FTO
Measurement source
12001-12002 · Figure 1c; Figure S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
crystallinity / preferred orientationgood crystallinity; c-axis parallel to FTOText
Qualitative
12001-12002 · Figure 1c; Figure S9

thin-film X-ray diffraction

Zn(NDI)0.8(PMDI)0.2 thin film on FTO · Thin Film

Experimental thin-film XRD compared with simulated powder XRD; preferred orientation assessed.

Context
pristine framework thin film on FTO
Measurement source
12001-12002 · Figure 1c; Figure S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
crystallinity / preferred orientationgood crystallinity; c-axis parallel to FTOText
Qualitative
12001-12002 · Figure 1c; Figure S9

thin-film X-ray diffraction

Zn(PMDI) thin film on FTO · Thin Film

Experimental thin-film XRD compared with simulated powder XRD; preferred orientation assessed.

Context
pristine framework thin film on FTO
Measurement source
12001-12002 · Figure 1c; Figure S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PMDI linker head-to-head distance14.2 ÅCaption
Exact Reported
12001 · Figure 1a
crystallinity / preferred orientationgood crystallinity; c-axis parallel to FTOText
Qualitative
12001-12002 · Figure 1c; Figure S9