Measurement evidence
Ag Nanoparticles-Induced Metallic Conductivity in Thin Films of 2D Metal-Organic Framework Cu3(HHTP)2 · Saha S., Ananthram K.S., Hassan N. et al. · Nano Letters · 2023 · 9326-9332
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
AgNPs@Cu3(HHTP)2 thin film · Thin Film
Room-temperature XRD pattern after AgNP incorporation
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Au substrate XRD peak | ~17.4 degrees 2theta | — | — | Caption Approximate | S13 · Figure caption · Figure S9 |
| Au substrate XRD peak | ~19.4 degrees 2theta | — | — | Caption Approximate | S13 · Figure caption · Figure S9 |
AgNPs@CuTCNQ thin film · Thin Film
Room-temperature XRD pattern after AgNP modification
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
Pristine Cu3(HHTP)2 thin film · Thin Film
Room-temperature XRD pattern compared to simulated Cu3(HHTP)2
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu3(HHTP)2 XRD peak, (200) | ~9.8 degrees 2theta | — | — | Text Approximate | 2 · Structural characterization · Figure S9 |
| Cu3(HHTP)2 XRD peak, (210) | ~12.9 degrees 2theta | — | — | Text Approximate | 2 · Structural characterization · Figure S9 |
Pristine CuTCNQ thin film · Thin Film
Room-temperature XRD pattern compared to simulated CuTCNQ
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|