Electrical Transport — Ag Nanoparticles-Induced Metallic Conductivity in Thin Films of 2D Metal-Organic Framework Cu3(HHTP)2

15 measurement groups · 23 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@Cu3(HHTP)2 thin film · Thin Film

Room-temperature I-V at 300 K

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: target composite
Measurement source: 2 · Electrical transport · Figure 2a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Conductance at 300 KMarked as a best value within this paper	~2 x 10^-1 S	—	—	Text Approximate	2 · Electrical transport · Figure 2a
Conductance enhancement versus pristine Cu3(HHTP)2Marked as a best value within this paper	~10^5-fold	—	—	Text Approximate	2 · Electrical transport · Figure 2a

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@Cu3(HHTP)2 thin film · Thin Film

Temperature-dependent I-V profiles from 200 to 373 K

Temperature: 200-373
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: target composite
Measurement source: 2-3 · Electrical transport · Figure 2c

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Approximate conductivity near 365 K from Figure S16	about 150 S m^-1 near 365 K	—	—	Figure Axis Approximate	S20 · Figure · Figure S16a
Approximate conductivity near 210 K from Figure S16	about 4500 S m^-1 near 210 K	—	—	Figure Axis Approximate	S20 · Figure · Figure S16a
Variable-temperature transport trendMarked as a best value within this paper	conductance increases on cooling from 373 K to 200 K; metallic conduction	—	—	Text Qualitative	3 · Electrical transport · Figure 2c

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@Cu-TCPP thin film · Thin Film

Room-temperature I-V at 300 K

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: AgNP-decorated 2D MOF control
Measurement source: S29 · Figure caption · Figure S25g

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Conductance at 300 K	10^-11 S	—	—	Caption Approximate	S29 · Figure caption · Figure S25g

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@Cu-TCPP thin film · Thin Film

Temperature-dependent I-V profile from 298 to 373 K

Temperature: 298-373
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: AgNP-decorated 2D MOF control
Measurement source: S29 · Figure caption · Figure S25h

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Variable-temperature transport behaviour	semiconducting charge transport characteristics	—	—	Caption Qualitative	S29 · Figure caption · Figure S25h

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@CuTCNQ thin film · Thin Film

Room-temperature I-V at 300 K

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: AgNP composite comparator
Measurement source: 3 · Electrical transport · Figure 3a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Conductance at 300 K	~4.7 x 10^-4 S	—	—	Text Approximate	3 · Electrical transport · Figure 3a

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@CuTCNQ thin film · Thin Film

Temperature-dependent I-V profiles from 200 to 373 K

Temperature: 200-373
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: AgNP composite comparator
Measurement source: 3 · Electrical transport · Figure 3b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Approximate conductivity near 365 K from Figure S16	about 225 S m^-1 near 365 K	—	—	Figure Axis Approximate	S20 · Figure · Figure S16b
Variable-temperature transport trend	conductance decreases on cooling; semiconducting behavior retained	—	—	Text Qualitative	3 · Electrical transport · Figure 3b

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

Pristine Cu3(HHTP)2 thin film · Thin Film

Room-temperature I-V at 300 K

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: pristine control
Measurement source: 2 · Electrical transport · Figure 2a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Conductance at 300 K	~1 x 10^-6 S	—	—	Text Approximate	2 · Electrical transport · Figure 2a

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

Pristine Cu3(HHTP)2 thin film · Thin Film

Temperature-dependent I-V profiles from 200 to 373 K

Temperature: 200-373
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: pristine control
Measurement source: 2-3 · Electrical transport · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Variable-temperature transport trend	semiconducting system trend	—	—	Text Qualitative	3 · Electrical transport · Figure 2b

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

Pristine Cu-TCPP thin film · Thin Film

Room-temperature I-V at 300 K

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: insulating 2D MOF control
Measurement source: S29 · Figure caption · Figure S25g

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Conductance at 300 K	~10^-13 S	—	—	Caption Approximate	S29 · Figure caption · Figure S25g

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

Pristine CuTCNQ thin film · Thin Film

Room-temperature I-V at 300 K

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: pristine CuTCNQ comparator
Measurement source: 3 · Electrical transport · Figure 3a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Conductance at 300 K	~7 x 10^-7 S	—	—	Text Approximate	3 · Electrical transport · Figure 3a

Cross-plane current-density-voltage (J-V) analysis

AgNPs@Cu3(HHTP)2 thin film · Thin Film

Conductivity estimated from J-V plots using EGaIn top contact

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: target composite
Measurement source: 3 · Electrical transport · Figure S15

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Estimated cross-plane conductivityMarked as a best value within this paper	~3200 S m^-1	—	—	Text Approximate	3 · Electrical transport · Figure S15

Cross-plane current-density-voltage (J-V) analysis

AgNPs@CuTCNQ thin film · Thin Film

Conductivity estimated from J-V plots using EGaIn top contact

Temperature: 300
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: AgNP composite comparator
Measurement source: 3 · Electrical transport · Figure S15

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Estimated cross-plane conductivity	~5.6 S m^-1	—	—	Text Approximate	3 · Electrical transport · Figure S15

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@Cu3(HHTP)2 thin film, 10 min AgOAc dipping · Thin Film

Ag-content series I-V and variable-temperature I-V; 10 min AgOAc dipping

Temperature: 298-373
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: Ag-content threshold series
Measurement source: S18 · Figure caption · Figure S14

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Variable-temperature transport behaviour	metallic charge transport	—	—	Caption Qualitative	S18 · Figure caption · Figure S14
Cu(K-edge):Ag(L-edge) ratio	~3.3 : 2.7	—	—	Caption Approximate	S18 · Figure caption · Figure S14

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@Cu3(HHTP)2 thin film, 20 min AgOAc dipping · Thin Film

Ag-content series I-V and variable-temperature I-V; 20 min AgOAc dipping

Temperature: 298-373
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: Ag-content threshold series
Measurement source: S18 · Figure caption · Figure S14

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Room-temperature conductance enhancement	~5 orders of magnitude	—	—	Caption Approximate	S18 · Figure caption · Figure S14
Cu(K-edge):Ag(L-edge) ratio	~3.9 : 3.4	—	—	Caption Approximate	S18 · Figure caption · Figure S14

Current-voltage (I-V) using Keithley 4200 SCS parameter analyser on Everbeing probe station with EGaIn contact electrode

Electrical conductivity

AgNPs@Cu3(HHTP)2 thin film, 5 min AgOAc dipping · Thin Film

Ag-content series I-V and variable-temperature I-V; 5 min AgOAc dipping

Temperature: 298-373
Atmosphere: not stated
Geometry: Cross-plane thin-film EGaIn top contact; optical image gives contact diameter ca. 530 um
Context: Ag-content threshold series
Measurement source: S18 · Figure caption · Figure S14

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Room-temperature conductance enhancement	~2 orders of magnitude	—	—	Caption Approximate	S18 · Figure caption · Figure S14
Variable-temperature transport behaviour	semiconducting nature retained	—	—	Caption Qualitative	S18 · Figure caption · Figure S14
Cu(K-edge):Ag(L-edge) ratio	~3.2 : 2.1	—	—	Caption Approximate	S18 · Figure caption · Figure S14