SEM, optical microscopy, FE-TEM, and STEM-EDS
PCN-222/P3HT blend film series · Thin Film
Morphology and elemental mapping of P3HT films blended with different PCN-222 contents.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PCN-222 dispersion threshold | well dispersed when concentration is less than 50 wt% | — | threshold is stated qualitatively as less than 50 wt% | Text Qualitative | 5 · 3. Results and discussion · Fig. 3a; Fig. S2 referenced |
| blend film thickness | ~100 nm | — | approximate | Text Approximate | 5 · 3. Results and discussion · Fig. S1 referenced |
| PCN-222 nanocrystal length in blend film | 300-500 nm | — | range 300-500 nm | Text Range | 5 · 3. Results and discussion · Fig. 3b |