High-resolution TEM with FFT
Exfoliated Cu2(OHPTP) nanosheets · Nanosheet
Zeiss Libra 200 kV HR-TEM; samples suspended by sonication and dropped on copper grids.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRTEM/FFT interlayer distance | 0.31 nm | 0.31 nm | — | Text Exact Reported | 5 · Results and Discussion · Figure 2a |
| maximum pore diameter from HRTEM | 1.5 nm | 1.5 nm | — | Text Rounded Reported | 5 · Results and Discussion · Figure 2b |
| HRTEM resolution | down to 1.2 Angstrom | 0.12 nm | — | Text Rounded Reported | 5 · Results and Discussion · Figure 2 |