Microscopy Morphology — Near IR Bandgap Semiconducting 2D Conjugated Metal-Organic Framework with Rhombic Lattice and High Mobility

Measurement evidence

Microscopy Morphology

Near IR Bandgap Semiconducting 2D Conjugated Metal-Organic Framework with Rhombic Lattice and High Mobility · Sporrer L., Zhou G., Wang M. et al. · Angewandte Chemie - International Edition · 2023 · e202300186

2 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

High-resolution TEM with FFT

Exfoliated Cu2(OHPTP) nanosheets · Nanosheet

Zeiss Libra 200 kV HR-TEM; samples suspended by sonication and dropped on copper grids.

Context
pristine framework lattice imaging
Measurement source
5 · Results and Discussion · Figure 2a-b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
HRTEM/FFT interlayer distance0.31 nm0.31 nmText
Exact Reported
5 · Results and Discussion · Figure 2a
maximum pore diameter from HRTEM1.5 nm1.5 nmText
Rounded Reported
5 · Results and Discussion · Figure 2b
HRTEM resolutiondown to 1.2 Angstrom0.12 nmText
Rounded Reported
5 · Results and Discussion · Figure 2

SEM with EDX mapping

Cu2(OHPTP) rod-like single crystals · Single Crystal

Zeiss Gemini 500; powder on carbon pad or MeOH suspension spin-coated to Si substrate.

Context
pristine framework morphology and elemental distribution
Measurement source
3 · Results and Discussion · Figure 1b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EDX elemental distributionuniform distribution of copper, carbon and oxygenText
Qualitative
3 · Results and Discussion · Figure 1b
rod lengthlengths in the um rangeText
Qualitative
3 · Results and Discussion · Figure 1b
rod widthwidths of several hundreds of nanometersText
Qualitative
3 · Results and Discussion · Figure 1b