Diffraction Structure — A highly crystalline anthracene-based MOF-74 series featuring electrical conductivity and luminescence

Measurement evidence

Diffraction Structure

A highly crystalline anthracene-based MOF-74 series featuring electrical conductivity and luminescence · Scheurle P.I., Mahringer A., Jakowetz A.C. et al. · Nanoscale · 2019 · 20949-20955

5 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

powder X-ray diffraction with Rietveld refinement

ANMOF-74(Co) bulk powder · Powder

PXRD pattern calculated/refined against model structure; XRD with Ni-filtered Cu Kalpha radiation in Bragg-Brentano geometry per SI methods.

Atmosphere
ambient/not specified
Geometry
powder diffraction
Context
pristine ANMOF-74 powder
Measurement source
20950-20951 · Results and discussion · Fig. 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Rietveld unit cell ANMOF-74(Co)R3 (146), a=b=46.11 A, c=5.92 A, alpha=beta=90 deg, gamma=120 degSI Table
Exact Reported
S17 · Unit cell parameters and atomic coordinates
Rietveld Rwp ANMOF-74(Co)Rwp = 4.18%SI Table
Exact Reported
S17 · Unit cell parameters and atomic coordinates

powder X-ray diffraction with Rietveld refinement

ANMOF-74(Mg) bulk powder · Powder

PXRD pattern calculated/refined against model structure; XRD with Ni-filtered Cu Kalpha radiation in Bragg-Brentano geometry per SI methods.

Atmosphere
ambient/not specified
Geometry
powder diffraction
Context
pristine ANMOF-74 powder
Measurement source
20950-20951 · Results and discussion · Fig. 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Rietveld unit cell ANMOF-74(Mg)R3 (146), a=b=46.36 A, c=6.05 A, alpha=beta=90 deg, gamma=120 degSI Table
Exact Reported
S15 · Unit cell parameters and atomic coordinates
Rietveld Rwp ANMOF-74(Mg)Rwp = 6.96%SI Table
Exact Reported
S15 · Unit cell parameters and atomic coordinates

powder X-ray diffraction with Rietveld refinement

ANMOF-74(Mn) bulk powder · Powder

PXRD pattern calculated/refined against model structure; XRD with Ni-filtered Cu Kalpha radiation in Bragg-Brentano geometry per SI methods.

Atmosphere
ambient/not specified
Geometry
powder diffraction
Context
pristine ANMOF-74 powder
Measurement source
20950-20951 · Results and discussion · Fig. 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Rietveld unit cell ANMOF-74(Mn)R3 (146), a=b=46.21 A, c=5.69 A, alpha=beta=90 deg, gamma=120 degSI Table
Exact Reported
S18 · Unit cell parameters and atomic coordinates
Rietveld Rwp ANMOF-74(Mn)Rwp = 4.38%SI Table
Exact Reported
S18 · Unit cell parameters and atomic coordinates

powder X-ray diffraction with Rietveld refinement

ANMOF-74(Ni) bulk powder · Powder

PXRD pattern calculated/refined against model structure; XRD with Ni-filtered Cu Kalpha radiation in Bragg-Brentano geometry per SI methods.

Atmosphere
ambient/not specified
Geometry
powder diffraction
Context
pristine ANMOF-74 powder
Measurement source
20950-20951 · Results and discussion · Fig. 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Rietveld unit cell ANMOF-74(Ni)R3 (146), a=b=46.21 A, c=5.76 A, alpha=beta=90 deg, gamma=120 degSI Table
Exact Reported
S16 · Unit cell parameters and atomic coordinates
Rietveld Rwp ANMOF-74(Ni)Marked as a best value within this paperRwp = 3.94%SI Table
Exact Reported
S16 · Unit cell parameters and atomic coordinates

powder X-ray diffraction with Rietveld refinement

ANMOF-74(Zn) bulk powder · Powder

PXRD pattern calculated/refined against model structure; XRD with Ni-filtered Cu Kalpha radiation in Bragg-Brentano geometry per SI methods.

Atmosphere
ambient/not specified
Geometry
powder diffraction
Context
pristine ANMOF-74 powder
Measurement source
20950-20951 · Results and discussion · Fig. 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Anthracene interlayer distance along c direction5.7 AText
Approximate
20950 · Results and discussion · Fig. 1B
Rietveld unit cell ANMOF-74(Zn)R3 (146), a=b=46.06 A, c=5.78 A, alpha=beta=90 deg, gamma=120 degSI Table
Exact Reported
S14 · Unit cell parameters and atomic coordinates
ANMOF-74 channel aperture2 nm pore aperturesText
Qualitative
20950 · Results and discussion · Fig. 1; Fig. 2
Rietveld Rwp ANMOF-74(Zn)Rwp = 6.74%SI Table
Exact Reported
S14 · Unit cell parameters and atomic coordinates