PXRD of dropcast films after sonication
Ni3(HHTP)2 dropcast on glassy carbon electrode · Electrode
Dropcast HHTP MOF films after 5 h sonication compared with powder and simulated stacking patterns.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Dropcast film structure retention | MOFs retained crystalline structure and rod-like morphology after 5 h sonication. | — | — | Text Qualitative | 555 · Characterization of HHTP MOFs · Figures S7-S11 |