SEM, TEM, HRTEM and EDX mapping.
truxone-Cu MOF powder/nanosheets · Powder
TEM on carbon-coated copper grid after N2 drying at 200 keV; SEM suspension on silicon wafer with conducting resin.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRTEM pi-pi stacking distance | 3.4 Angstrom | — | — | Text Exact Reported | p004 / article p.12693 · Results and Discussion · Figure 2b |
| SEM leaf width | about 35 nm width | — | about | Text Approximate | p004 / article p.12693 · Results and Discussion · Figure 2a; Figure S13 |