Two-probe current-density-voltage (J-V) measurement using Keithley 2635B; Cheung analysis of Schottky diode parameters
Al/compound 1/ITO thin-film metal-semiconductor device · Thin Film
Room temperature (303 K), dark ambient condition; Al/compound/ITO metal-semiconductor device; effective area 7.065 x 10-6 m2; film thickness 1 micrometre.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Schottky barrier heightMarked as a best value within this paper | 0.693 eV | — | — | Table Exact Reported | p007 / journal page 12779 · Electrical Characterization · Table 1 |
| electrical conductivityMarked as a best value within this paper | 1.10 x 10-5 S m-1 | 0.000011 S m-1 | — | Table Exact Reported | p007 / journal page 12779 · Electrical Characterization · Table 1 |
| effective diode area | 7.065 x 10-6 m2 | 0.000007065 m2 | — | Text Exact Reported | p020 / SI page 20 · Device Fabrication |
| device film thickness | one micrometre | 0.000001 m | — | Text Rounded Reported | p020 / SI page 20 · Device Fabrication |
| Schottky ideality factor | 2.06 | — | — | Table Exact Reported | p007 / journal page 12779 · Electrical Characterization · Table 1 |
| approximate current density at +1 V | approximately 70 A/m2 at +1 V from Figure 7a | — | visual estimate | Figure Axis Approximate | p006 / journal page 12778 · Figure 7 · Figure 7a |
| rectification ratio | 8.75 | — | — | Table Exact Reported | p007 / journal page 12779 · Electrical Characterization · Table 1 |
| series resistance from dV/dlnJMarked as a best value within this paper | 6.21 kOhm | 6210 Ohm | — | Table Exact Reported | p007 / journal page 12779 · Electrical Characterization · Table 1 |
| series resistance from H(J) | 6.34 kOhm | 6340 Ohm | — | Table Exact Reported | p007 / journal page 12779 · Electrical Characterization · Table 1 |
| lnJ-lnV region I slope | 1 | — | — | Text Exact Reported | p007 / journal page 12779 · Electrical Characterization · Figure 8a |
| lnJ-lnV region II slope | 2 | — | — | Text Exact Reported | p007 / journal page 12779 · Electrical Characterization · Figure 8a |