cMOF Evidence Base
Microscopy Morphology — Why conductivity is not always king-physical properties governing the capacitance of 2D metal-organic framework-based EDLC supercapacitor electrodes: A Ni3(HITP)2case study

Measurement evidence

Microscopy Morphology

Why conductivity is not always king-physical properties governing the capacitance of 2D metal-organic framework-based EDLC supercapacitor electrodes: A Ni3(HITP)2case study · Borysiewicz M.A., Dou J.-H., Stassen I. et al. · Faraday Discussions · 2021 · 298-304

3 measurement groups · 11 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM using Zeiss Supra 55Vp FEG SEM with 14 kV operating voltage and in-lens secondary electron detector.

Scanning electron microscopy

HITP_A Ni3(HITP)2 powder batch · Powder

Dry powder morphology; stable under electron-beam irradiation.

Context
Pristine powder batch.
Measurement source
SI p.S1 · Characterization · Fig. 1; Fig. S1; Table 1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Agglomerate diameter range500 nm to over 2 um——Text
Range		main p.3, article p.300 · Main text · Fig. 1e
Crystal length/width aspect ratioMarked as a best value within this paper12.1——Table
Exact Reported		main p.3, article p.300 · Main text · Table 1
Mean crystal lengthMarked as a best value within this paper202 nm——Table
Rounded Reported		main p.2, article p.299 · Main text · Table 1
Mean crystal width16 nm——Table
Rounded Reported		main p.2, article p.299 · Main text · Table 1

SEM using Zeiss Supra 55Vp FEG SEM with 14 kV operating voltage and in-lens secondary electron detector.

Scanning electron microscopy

HITP_B Ni3(HITP)2 powder batch · Powder

Dry powder morphology; stable under electron-beam irradiation.

Context
Pristine powder batch.
Measurement source
SI p.S1 · Characterization · Fig. 1; Fig. S1; Table 1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Agglomerate diameter range for HITP_B/HITP_CMarked as a best value within this paper200-500 nm——Text
Range		main p.3, article p.300 · Main text · Fig. 1f
Crystal length/width aspect ratio3.4——Table
Exact Reported		main p.3, article p.300 · Main text · Table 1
Mean crystal length84 nm——Table
Rounded Reported		main p.2, article p.299 · Main text · Table 1
Mean crystal width24 nm——Table
Rounded Reported		main p.2, article p.299 · Main text · Table 1

SEM using Zeiss Supra 55Vp FEG SEM with 14 kV operating voltage and in-lens secondary electron detector.

Scanning electron microscopy

HITP_C Ni3(HITP)2 powder batch · Powder

Dry powder morphology; stable under electron-beam irradiation.

Context
Pristine powder batch.
Measurement source
SI p.S1 · Characterization · Fig. S1; Table 1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Crystal length/width aspect ratio2.7——Table
Exact Reported		main p.3, article p.300 · Main text · Table 1
Mean crystal length78 nm——Table
Rounded Reported		main p.2, article p.299 · Main text · Table 1
Mean crystal widthMarked as a best value within this paper29 nm——Table
Rounded Reported		main p.2, article p.299 · Main text · Table 1