Electrical Transport — Novel Solid-State Solar Cell Based on Hole-Conducting MOF-Sensitizer Demonstrating Power Conversion Efficiency of 2.1%

5 measurement groups · 13 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Co-DAPV film on glass · Thin Film

Resistivity of Co-DAPV film in dark/ambient condition and under 1 sun illumination.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Co-DAPV film resistivity	28.62 ohm cm	—	—	Text Exact Reported	12931 · Results
Co-DAPV film resistivity under 1 sunMarked as a best value within this paper	0.24 ohm cm when the measurement was performed under 1 sun light irradiation	—	—	Text Exact Reported	12931 · Results

Co-DAPV film on glass · Thin Film

Hall measurement used to determine carrier type, hole concentration and mobility.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
carrier type	p-type characteristic	—	—	Text Qualitative	12931 · Results
hole concentration	3.35 x 10+8 cm3	—	—	Text Exact Reported	12931 · Results
hole mobility	0.017 cm2 V-1 s-1	—	—	Text Exact Reported	12931 · Results

iodine-induced hole-doped Co-NDC film on glass · Thin Film

Iodine-induced hole-doped Co-NDC film measured under similar conditions as comparison.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
iodine-doped Co-NDC resistivity	5.37 x 10^6 ohm cm	—	—	Text Exact Reported	12931 · Results

Co-DAPV film on glass · Thin Film

Resistance of Co-DAPV film on glass measured as a function of temperature from 300 to 650 K.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Co-DAPV resistance at 300 K	approximately 63 Mohm at 300 K	—	visual estimate	Figure Axis Approximate	S-4 · Figure S2 · Figure S2
Co-DAPV resistance at 650 KMarked as a best value within this paper	approximately 22 Mohm at 650 K	—	visual estimate	Figure Axis Approximate	S-4 · Figure S2 · Figure S2
temperature dependence interpretation	resistance decreases with increasing temperature, revealing semiconductor nature	—	—	Caption Qualitative	S-4 · Figure S2 caption · Figure S2

Co-DAPV film on glass · Thin Film

Current density-bias curves for glass, glass/Co-NDC, glass/Co-DAPV in dark, and glass/Co-DAPV under light.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Co-DAPV dark current density at +2 V	approximately -0.10 microA cm-2 at +2 V	—	visual estimate	Figure Axis Approximate	S-3 · Figure S1 · Figure S1
Co-DAPV light current density at +2 VMarked as a best value within this paper	approximately -0.15 microA cm-2 at +2 V	—	visual estimate	Figure Axis Approximate	S-3 · Figure S1 · Figure S1
Co-NDC comparison current density at +2 V	approximately -0.015 microA cm-2 at +2 V	—	visual estimate	Figure Axis Approximate	S-3 · Figure S1 · Figure S1
bare glass current density at +2 V	approximately 0 microA cm-2 at +2 V	—	visual estimate	Figure Axis Approximate	S-3 · Figure S1 · Figure S1