continuous rotation electron diffraction (c-RED), PXRD Pawley/Rietveld refinement
as-synthesised Cu4DHTTB crystals/powder · Powder
3D ED data collected on JEOL JEM2100 TEM at 200 kV; PXRD with Cu K alpha radiation over 5-80 deg 2theta in Bragg-Brentano reflection mode.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| unit cell a | a = 9.3150(19) A | — | (19) | SI Table Exact Reported | SI p. 23 · Table S2 · Table S2 |
| unit cell b | b = 4.4800(9) A | — | (9) | SI Table Exact Reported | SI p. 23 · Table S2 · Table S2 |
| unit cell beta | beta = 90.742(7) deg | — | (7) | SI Table Exact Reported | SI p. 23 · Table S2 · Table S2 |
| unit cell c | c = 11.925(2) A | — | (2) | SI Table Exact Reported | SI p. 23 · Table S2 · Table S2 |
| unit cell volume | V = 497.60(17) A3 | — | (17) | SI Table Exact Reported | SI p. 23 · Table S2 · Table S2 |
| c-RED maximum resolution | up to 0.7 A; SI Figure S7 says 0.707 A | — | — | Caption Rounded Reported | SI p. 15 · Figure S7 · Figure S7 |
| intersection angle between adjacent ligand planes | about 75.12 deg | — | — | Text Approximate | 2433 · Results and Discussion · Figure 2c |
| adjacent pi-pi stacked DHTTB plane distance | about 3.52 A | — | — | Text Approximate | 2433 · Results and Discussion · Figure 2b |
| PXRD refinement Rp | Rp = 1.71% | — | — | Text Exact Reported | 2433 · Results and Discussion · Figure 1e |
| PXRD refinement Rwp | Rwp = 2.99% | — | — | Text Exact Reported | 2433 · Results and Discussion · Figure 1e |
| ribbon-like pi-d chain width | width < 1 nm | — | < | Text Approximate | 2433 · Results and Discussion · Figure 2d,f |
| space group | P21/n | — | — | Text Exact Reported | 2433 · Results and Discussion · Table S2 |