| Cu3(HHTP)2 thin film fabricated by MiCSresearch_0257__mat__mat_cu3_hhtp2 | Thin Film · Pristine Control · Pristine Framework | microfluidic-based solution-sheared thin film, washed with DMSO and ethanoloxygen-plasma-treated glass, silicon wafer, or alumina; sensing devices used Al2O3 · ~100 nm in Supplementary Table 1; thickness depends on shearing speed | 6 · Methods |
| Cu3(HHTP)2 powder drop-coated sensorresearch_0257__mat__mat_cu3_hhtp2 | Powder · Pristine Control · Pristine Framework | Cu3(HHTP)2 powder suspension drop-coated from ethanol onto aluminaAl2O3 sensor substrate with Au electrodes | 7 · Methods |
| Cu3(HHTP)2 thick film collected for BETresearch_0257__mat__mat_cu3_hhtp2 | Thin Film · Pristine Control · Pristine Framework | thick MiCS-derived films evacuated before N2 adsorptionabout 1.35 um thick films; 15-20 films collected for ~20 mg sample | S25 · Supplementary Fig. 14 · Supplementary Fig. 14 |
| MiCS serpentine-channel CFD modelresearch_0257__mat__mat_mics_channel_model | Model · Model System · Model | COMSOL steady-state laminar-flow and mass-transfer model | 6 · Methods · Supplementary Fig. 5 |
| Pt@Cu3(HHTP)2 conventional solution-sheared filmresearch_0257__mat__mat_pt_cu3_hhtp2 | Thin Film · Composite Sample · Guest Loaded | all components premixed as a bulk solution before coatingglass substrate in Fig. 2f; 150 deg C shearing condition in Supplementary Fig. 7 | 3 · Results · Fig. 2f |
| Pt@Cu3(HHTP)2 thin-film Pt-loading seriesresearch_0257__mat__mat_pt_cu3_hhtp2 | Thin Film · Target Sample · Guest Loaded | MiCS Pt precursor solution varied at 50, 100, 150, and 200 uL/minAl2O3 for sensing optimisation; other substrates possible for film coating · not separately specified for each Pt precursor flow | S9 · Supplementary Table 6 · Supplementary Table 6 |
| Pt@Cu3(HHTP)2 thin film, 100 uL/min Pt precursorresearch_0257__mat__mat_pt_cu3_hhtp2 | Thin Film · Target Sample · Guest Loaded | MiCS film grown at 150 deg C, 100 um blade-substrate gap, 30 deg blade angle; washed with DMSO and ethanoloxygen-plasma-treated glass, silicon wafer, or alumina; sensing devices used Al2O3 · tens of nanometres by Fig. 3e; ~100 nm in Supplementary Table 1 | 5 · Sensing characteristics · Supplementary Table 6 |
| Pt@Cu3(HHTP)2 thick film collected for BETresearch_0257__mat__mat_pt_cu3_hhtp2 | Thin Film · Target Sample · Guest Loaded | thick MiCS-derived films evacuated before N2 adsorptionabout 1.35 um thick films; 15-20 films collected for ~20 mg sample | S25 · Supplementary Fig. 14 · Supplementary Fig. 14 |