Electrical Transport — Large-area synthesis of nanoscopic catalyst-decorated conductive MOF film using microfluidic-based solution shearing

4 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Pt@Cu3(HHTP)2 conventional solution-sheared film · Thin Film

Conventional solution-sheared comparison film; N >= 30.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Conventional solution-sheared film resistance coefficient of variation	58.5%	—	N >= 30	Figure Axis Rounded Reported	S26 · Supplementary Fig. 15 · Supplementary Fig. 15c
Conventional solution-sheared film surface roughness Ra	92.3 nm	—	—	Text Exact Reported	3 · Results · Supplementary Fig. 7

Cu3(HHTP)2 thin film fabricated by MiCS · Thin Film

Conductivity of MiCS Cu3(HHTP)2 film reported in Supplementary Table 1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(HHTP)2 MiCS film conductivity at room temperature	2 x 10^-2 S/cm	—	—	SI Table Exact Reported	S4 · Supplementary Table 1 · Supplementary Table 1

Pt@Cu3(HHTP)2 thin film, 100 uL/min Pt precursor · Thin Film

Electrical-property comparison of MiCS and conventional solution-sheared C-MOF films; N >= 30.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
MiCS film resistance coefficient of variationMarked as a best value within this paper	15.1%	—	N >= 30	Figure Axis Rounded Reported	S26 · Supplementary Fig. 15 · Supplementary Fig. 15c

Pt@Cu3(HHTP)2 thin film, 100 uL/min Pt precursor · Thin Film

Conductivity of MiCS Pt@Cu3(HHTP)2 film reported in Supplementary Table 1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Pt@Cu3(HHTP)2 MiCS film conductivity at room temperature	1 x 10^-3 S/cm	—	—	SI Table Exact Reported	S4 · Supplementary Table 1 · Supplementary Table 1