cMOF Evidence Base
Microscopy Morphology — Large-area synthesis of nanoscopic catalyst-decorated conductive MOF film using microfluidic-based solution shearing

Measurement evidence

Microscopy Morphology

Large-area synthesis of nanoscopic catalyst-decorated conductive MOF film using microfluidic-based solution shearing · Kim J.-O., Koo W.-T., Kim H. et al. · Nature Communications · 2021 · 4294

2 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and AFM

Scanning electron microscopyAtomic force microscopy

Pt@Cu3(HHTP)2 thin film, 100 uL/min Pt precursor · Thin Film

Film morphology, crystallite size, roughness and AFM thickness profiling

Geometry
thin film on substrate
Context
Pt-loaded target film
Measurement source
3 · Characterizations · Fig. 2g,h; Fig. 3e
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Pt@Cu3(HHTP)2 MiCS film surface roughness RaMarked as a best value within this paper2.8 nm——Text
Exact Reported		3 · Results · Supplementary Fig. 7
Average Pt@Cu3(HHTP)2 crystallite size in thin film25 nm——Text
Exact Reported		3 · Characterizations · Supplementary Fig. 8
Pt@Cu3(HHTP)2 film thickness at 2 mm/s shearing speedabout 70 nm——Figure Axis
Approximate		4 · Characterizations · Fig. 3e
Pt@Cu3(HHTP)2 film thickness at 3 mm/s shearing speedabout 50 nm——Figure Axis
Approximate		4 · Characterizations · Fig. 3e
Pt@Cu3(HHTP)2 film thickness at 4 mm/s shearing speedabout 38 nm——Figure Axis
Approximate		4 · Characterizations · Fig. 3e
Pt@Cu3(HHTP)2 film thickness at 5 mm/s shearing speedabout 30 nm——Figure Axis
Approximate		4 · Characterizations · Fig. 3e
Thickness dependence on shearing speed exponent-0.99——Text
Exact Reported		4 · Characterizations · Fig. 3e

cryo-TEM, HRTEM, STEM, TEM-EDS

Transmission electron microscopyElemental microanalysis and mapping

Pt@Cu3(HHTP)2 thin film, 100 uL/min Pt precursor · Thin Film

Identification of Pt particles in Cu3(HHTP)2 pores and elemental mapping

Context
Pt-loaded target film
Measurement source
4 · Characterizations · Fig. 3a-d; Supplementary Fig. 10
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Empty Cu3(HHTP)2 [100] lattice spacing across five unit cellsca. 2.0 nm——Text
Approximate		4 · Characterizations · Fig. 3d
Pt(111) lattice spacing2.265 A——Text
Exact Reported		4 · Characterizations · Supplementary Fig. 10b
Average Pt nanoparticle diameter2 nm——Text
Exact Reported		4 · Characterizations · Supplementary Fig. 10