thin-film XRD and grazing-incidence XRD (GIXRD)
Cu3(HHTP)2 thin film, 200 nm, XRD specimen · Thin Film
Rigaku SmartLab with Cu Kalpha radiation, lambda = 1.54 A; out-of-plane 2theta 3-30 deg, 0.1 deg min^-1, 0.02 deg step; in-plane GIXRD alpha = 0.3 deg, 2theta 3-30 deg, 0.048 deg min^-1, 0.12 deg step.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| XRD specimen thickness | 200 nm | 2e-7 m | — | Caption Exact Reported | p006 · 2. Figures · Figure S1 |
| in-plane and out-of-plane orientation assignment | In-plane peaks assigned to (hk0); out-of-plane peak assigned to (00l); film grows epitaxially along c axis and in high orientation. | — | — | Text Qualitative | p002 · Results and Discussion · Figure S1 |