Spectroscopy — The Growth Mechanism of a Conductive MOF Thin Film in Spray-based Layer-by-layer Liquid Phase Epitaxy

Measurement evidence

Spectroscopy

The Growth Mechanism of a Conductive MOF Thin Film in Spray-based Layer-by-layer Liquid Phase Epitaxy · Zheng R., Fu Z.-H., Deng W.-H. et al. · Angewandte Chemie - International Edition · 2022 · e202212797

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

FT-IR spectroscopy

Infrared spectroscopy

Cu3(HHTP)2 thin film, 200 nm, XRD specimen · Thin Film

Measured using VERTEX70 (Bruker); comparison of HHTP ligand and Cu3(HHTP)2 film.

Geometry: thin film and ligand control
Context: pristine framework versus ligand control
Measurement source: p006 · 2. Figures · Figure S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HHTP hydroxyl deformation peak	1626 cm^-1 in HHTP; disappears in Cu3(HHTP)2 film	—	—	Caption Exact Reported	p006 · 2. Figures · Figure S2
HHTP hydroxyl stretch peak	3427 cm^-1 in HHTP; disappears in Cu3(HHTP)2 film	—	—	Caption Exact Reported	p006 · 2. Figures · Figure S2