Diffraction Structure — Semiconducting Supramolecular Organic Frameworks Assembled from a Near-Infrared Fluorescent Macrocyclic Probe and Fullerenes

Measurement evidence

Diffraction Structure

Semiconducting Supramolecular Organic Frameworks Assembled from a Near-Infrared Fluorescent Macrocyclic Probe and Fullerenes · Kaur R., Sen S., Larsen M.C. et al. · Journal of the American Chemical Society · 2020 · 11497-11505

3 measurement groups · 18 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Single-crystal X-ray diffraction; SHELXT/SHELXL refinement

single crystals of pristine receptor 2 · Single Crystal

Agilent Technologies SuperNova Dual Source diffractometer, micro-focused Cu Kalpha radiation, 100 K.

Temperature
100
Context
pristine receptor 2 control
Measurement source
S19-S20 · I) X-ray structure of the exTTFporphyrin cage, 2 · Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CCDC number1970803SI Table
Exact Reported
S21 · Table S1 · Table S1
Empirical formula from XRD refinementC111H94Cl9N8S16SI Table
Exact Reported
S20 · Table S1 · Table S1
Final R1 for I > 2sigma(I)R1 = 0.1095, wR2 = 0.2637SI Table
Exact Reported
S21 · Table S1 · Table S1
Space groupP-1SI Table
Exact Reported
S20 · Table S1 · Table S1
Unit cell volume2794.4(3) A^3(3)SI Table
Exact Reported
S20 · Table S1 · Table S1

Single-crystal X-ray diffraction; SHELXT/SHELXL refinement; PLATON SQUEEZE

single crystals of (2*C60)n SOF · Single Crystal

Agilent Technologies SuperNova Dual Source diffractometer, micro-focus Cu Kalpha radiation, 100 K; C60 refined as rigid groups.

Temperature
100
Context
C60-loaded SOF
Measurement source
S21-S23 · II) Single crystal X-ray structure of the supramolecular complex of 2 with C60 · Table S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CCDC number1991549SI Table
Exact Reported
S23 · Table S2 · Table S2
Calculated density0.417 Mg/m^3SI Table
Exact Reported
S22 · Table S2 · Table S2
Empirical formulaC168H92N8S16SI Table
Exact Reported
S22 · Table S2 · Table S2
Final R1 for I > 2sigma(I)R1 = 0.2122, wR2 = 0.4905SI Table
Exact Reported
S23 · Table S2 · Table S2
Space groupFdddSI Table
Exact Reported
S22 · Table S2 · Table S2
Unit cell volume87058(8) A^3(8)SI Table
Exact Reported
S22 · Table S2 · Table S2

Single-crystal X-ray diffraction; SHELXT/SHELXL refinement; PLATON SQUEEZE and OLEX2 model fitting

single crystals of (2*C70)n SOF · Single Crystal

Agilent Technologies SuperNova Dual Source diffractometer, micro-focus Cu Kalpha radiation, 100 K.

Temperature
100
Context
C70-loaded SOF
Measurement source
S24-S26 · III) Single crystal X-ray structure of the supramolecular complex of 2 with C70 · Table S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CCDC number1991548SI Table
Exact Reported
S26 · Table S3 · Table S3
Calculated density0.852 Mg/m^3SI Table
Exact Reported
S25 · Table S3 · Table S3
Disordered solvent regionapproximately 50% of the total unit cell volumeapproximatelyText
Approximate
S24-S25 · C70 crystal structure refinement · Table S3
Empirical formulaC378H64N16S32SI Table
Exact Reported
S25 · Table S3 · Table S3
Final R1 for I > 2sigma(I)R1 = 0.1939, wR2 = 0.4726SI Table
Exact Reported
S26 · Table S3 · Table S3
Space groupFdddSI Table
Exact Reported
S25 · Table S3 · Table S3
Unit cell volume91283(5) A^3(5)SI Table
Exact Reported
S25 · Table S3 · Table S3