Powder X-ray diffraction (XRD), Cu K-alpha radiation
HP-UiO-66 powder · Powder
D8 Advance, Bruker; 40 kV and 40 mA; compared with bare UiO-66, Zn/Zr MOFs and simulated patterns.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Characteristic UiO-66 XRD peak positions | 2theta = 7.3, 8.5, 14.8, 17.1, 18.3, 18.8, 21.9, 25.4, 27.9, 30.4, 31.9, 32.8, 35.4, 37.2, 39.2 deg | — | — | Text Exact Reported | p003 · Structure and Morphology · Figure 2a |
| No obvious MOF-5 peaks in Zn/Zr precursor XRD | No obvious characteristic peaks for Zn-MOFs (MOF-5) observed in bimetallic Zn/Zr MOFs precursor. | — | — | Text Qualitative | p003 · Structure and Morphology · Figure 2a |