Diffraction Structure — Conductive, Large-Area, and Continuous 7,7,8,8-Tetracyanoquinodimethane@HKUST-1 Thin Films Fabricated Using Solution Shearing

Measurement evidence

Diffraction Structure

Conductive, Large-Area, and Continuous 7,7,8,8-Tetracyanoquinodimethane@HKUST-1 Thin Films Fabricated Using Solution Shearing · Jung S., Huelsenbeck L., Hu Q. et al. · ACS Applied Materials and Interfaces · 2021 · 10202-10209

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

X-ray diffraction comparison to solvothermal HKUST-1

X-ray diffraction and scattering

Solution-sheared HKUST-1 thin film, 4 cycles · Thin Film

Solution-sheared HKUST-1 compared against solvothermal HKUST-1 reference in q-space.

Context: pristine solution-sheared HKUST-1 thin film
Measurement source: S-7 · Supporting Information · Figure S5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Solution-sheared HKUST-1 XRD peaks match solvothermal HKUST-1	Solution sheared peaks match closely with the solvothermal HKUST-1.	—	—	Caption Qualitative	S-7 · Supporting Information · Figure S5

X-ray diffraction, PANalytical Empyrean, Cu Kalpha, 45 kV and 40 mA

X-ray diffraction and scattering

Solvent-exchanged TCNQ@HKUST-1 thin film, loading time unspecified · Thin Film

XRD patterns compared solution-sheared HKUST-1 and TCNQ@HKUST-1.

Context: guest-loaded target versus pristine HKUST-1 control
Measurement source: 10204-10205 · Characterizations; Results and Discussion · Figure 3A

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HKUST-1 structure retained after TCNQ loading	XRD patterns stay consistent even after TCNQ loading	—	—	Text Qualitative	10205 · Results and Discussion · Figure 3A
No unique Cu(TCNQ) XRD peak after TCNQ loading	no unique peak characteristics of Cu(TCNQ) appear	—	down to XRD resolution	Text Qualitative	10205 · Results and Discussion · Figure 3A