Microscopy Morphology — Conductive, Large-Area, and Continuous 7,7,8,8-Tetracyanoquinodimethane@HKUST-1 Thin Films Fabricated Using Solution Shearing

9 measurement groups · 20 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Fiji image analysis of film coverage

Solution-sheared HKUST-1 thin film, 4 cycles · Thin Film

Thin-film coverage quantified for solution-shearing cycle count; detailed table in missing SI.

Context: pristine HKUST-1 film coverage
Measurement source: S-6 · Supporting Information · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HKUST-1 thin-film coverage after 1 solution-shearing cycle	60 +/- 1.1%	—	+/- 1.1%	SI Table Exact Reported	S-6 · Supporting Information · Table S1
HKUST-1 thin-film coverage after 2 solution-shearing cycles	80 +/- 0.9%	—	+/- 0.9%	SI Table Exact Reported	S-6 · Supporting Information · Table S1
HKUST-1 thin-film coverage after 3 solution-shearing cycles	89 +/- 0.7%	—	+/- 0.7%	SI Table Exact Reported	S-6 · Supporting Information · Table S1
HKUST-1 thin-film coverage after 4 solution-shearing cyclesMarked as a best value within this paper	99 +/- 0.6%	—	+/- 0.6%	SI Table Exact Reported	S-6 · Supporting Information · Table S1

Energy dispersive spectroscopy (EDS) elemental mapping with SEM image

Scanning electron microscopy Elemental microanalysis and mapping

Solution-sheared HKUST-1 thin film, 1 cycle · Thin Film

1st solution-sheared HKUST-1 thin film; Cu and Si maps compared.

Context: pristine HKUST-1 thin film after one cycle
Measurement source: S-3 · Supporting Information · Figure S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
One-cycle EDS indicates exposed Si-rich substrate regions	composition of Si is higher than that of Cu	—	—	Caption Qualitative	S-3 · Supporting Information · Figure S2

Energy dispersive spectroscopy (EDS) elemental mapping with SEM image

Scanning electron microscopy Elemental microanalysis and mapping

Solution-sheared HKUST-1 thin film, 4 cycles · Thin Film

4th solution-sheared HKUST-1 thin film; Cu and Si maps compared.

Context: pristine HKUST-1 thin film after four cycles
Measurement source: S-4 · Supporting Information · Figure S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Four-cycle EDS indicates complete HKUST-1 coverage except crack region	Si is low... HKUST-1 thin film is completely covered via multiple cycles	—	—	Caption Qualitative	S-4 · Supporting Information · Figure S3

Bruker Dektak XT profilometer

Solution-sheared HKUST-1 thin film, 4 cycles · Thin Film

Thickness measured with 800 um scan length for HKUST-1 films after multiple solution-shearing cycles.

Context: pristine HKUST-1 thin-film thickness evolution
Measurement source: 10204-10205 · Characterizations; Results and Discussion · Figure 2D

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HKUST-1 film thickness after 1 solution-shearing cycle	2.1 +/- 0.4 um	—	+/- 0.4 um	Text Exact Reported	10205 · Results and Discussion · Figure 2D
HKUST-1 film thickness after 2 solution-shearing cycles	ca. 3.3 um from Figure 2D	—	visually estimated error bar ca. +/- 0.4 um	Figure Axis Approximate	10204 · Results and Discussion · Figure 2D
HKUST-1 film thickness after 3 solution-shearing cycles	ca. 4.7 um from Figure 2D	—	visually estimated error bar ca. +/- 0.3 um	Figure Axis Approximate	10204 · Results and Discussion · Figure 2D
HKUST-1 film thickness after 4 solution-shearing cyclesMarked as a best value within this paper	5.4 +/- 0.8 um	—	+/- 0.8 um	Text Exact Reported	10205 · Results and Discussion · Figure 2D
Average thickness increase per solution-shearing cycle	increasing by an average of 1.2 um per cycle	—	—	Text Rounded Reported	10205 · Results and Discussion · Figure 2D

Scanning electron microscopy (FEI Quanta 650 SEM)

Scanning electron microscopy

Solution-sheared HKUST-1 thin film, 4 cycles · Thin Film

SEM comparison of 1st, 2nd, and 4th solution-shearing cycles.

Context: pristine HKUST-1 cycle-dependent film coverage
Measurement source: 10204 · Experimental Section; Results and Discussion · Figure 2A-C

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
No void regions observed in 4-cycle HKUST-1 filmMarked as a best value within this paper	No void regions are observed down to the resolution of SEM and EDS.	—	—	Text Qualitative	10205 · Results and Discussion · Figures 2C and S3

Scanning electron microscopy

Solution-sheared HKUST-1 thin film, 4 cycles · Thin Film

Intergrown HKUST-1 crystals after multiple solution-shearing cycles.

Context: pristine HKUST-1 thin film after multiple cycles
Measurement source: S-5 · Supporting Information · Figure S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Multiple cycles produce intergrown HKUST-1 crystals sharing crystal planes	HKUST-1 crystal shares their crystal plane with neighbor crystals	—	—	Caption Qualitative	S-5 · Supporting Information · Figure S4

Scanning electron microscopy

TCNQ@HKUST-1 thin film, 168 h TCNQ soak · Thin Film

SEM comparison of pristine HKUST-1, 24 h TCNQ@HKUST-1, and 168 h TCNQ@HKUST-1.

Context: guest-loaded target morphology and Cu(TCNQ) byproduct check
Measurement source: 10206 · Results and Discussion · Figure 4A-C

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Solvent-exchanged TCNQ@HKUST-1 lacks worm-like Cu(TCNQ) morphology	does not show the worm-like morphology that indicates the formation of Cu(TCNQ)	—	—	Text Qualitative	10206 · Results and Discussion · Figure 4A-C

Scanning electron microscopy

Thermally activated TCNQ@HKUST-1 thin films, 72 and 168 h TCNQ soak · Thin Film

Thermally activated HKUST-1 thin films soaked in TCNQ solution for 72 h and 168 h.

Context: thermal activation comparison for TCNQ@HKUST-1
Measurement source: S-8 · Supporting Information · Figure S6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Thermally activated TCNQ@HKUST-1 shows worm-shaped crystals after 168 h	SEM image of thermally activated 168 hrs of TCNQ@HKUST-1; worm-shaped crystals noted for this series	—	—	Caption Qualitative	S-8 · Supporting Information · Figure S6B
Thermally activated TCNQ@HKUST-1 shows worm-shaped crystals after 72 h	worm-shaped crystals after 72 hours; may represent Cu(TCNQ) side product	—	—	Caption Qualitative	S-8 · Supporting Information · Figure S6A

Optical microscopy with Fiji coverage quantification

HKUST-1 thin films from solution-shearing parameter screen · Thin Film

Heated-substrate temperature and coating speed varied: 160 deg C at 0.1, 0.5, and 1.5 mm s-1; 100 deg C at 0.5 mm s-1.

Context: pristine HKUST-1 thin-film parameter screen
Measurement source: S-2 · Supporting Information · Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Optical-image film coverage at 0.1 mm s-1 and 160 deg CMarked as a best value within this paper	98.8%	—	—	Visual Estimate Rounded Reported	S-2 · Supporting Information · Figure S1A
Optical-image film coverage at 0.5 mm s-1 and 100 deg C	83.9%	—	—	Visual Estimate Rounded Reported	S-2 · Supporting Information · Figure S1D
Optical-image film coverage at 0.5 mm s-1 and 160 deg C	95.0%	—	—	Visual Estimate Rounded Reported	S-2 · Supporting Information · Figure S1B
Optical-image film coverage at 1.5 mm s-1 and 160 deg C	76.4%	—	—	Visual Estimate Rounded Reported	S-2 · Supporting Information · Figure S1C