cMOF Evidence Base
Diffraction Structure — Activating a Metallization Switch for Record Hydrogen Evolution in Single-Atom Modified Polar MOF Piezocatalysts

Measurement evidence

Diffraction Structure

Activating a Metallization Switch for Record Hydrogen Evolution in Single-Atom Modified Polar MOF Piezocatalysts · Hao C., Guan X., Wu Y. et al. · Advanced Materials · 2026 · e23489

2 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Post-reaction XRD, SEM, HRTEM, HAADF-STEM, EDS mapping and XPS

X-ray photoelectron spectroscopyX-ray diffraction and scatteringScanning electron microscopyTransmission electron microscopyElemental microanalysis and mapping

Ni SAs@UiO-66-NH2 after piezocatalysis · Powder

Ni SAs@UiO-66-NH2 characterised before and after long-term ultrasonic piezocatalytic reaction.

Geometry
recovered powder
Context
Post-reaction target sample.
Measurement source
7 · Hydrogen Evolution Performance · Figure 3g and Figures S15-S16
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Post-reaction structural stabilityMorphology and diffraction pattern preserved; no crystalline by-products or framework decomposition observed.——Text
Qualitative		7 · Hydrogen Evolution Performance · Figure 3g and Figures S15-S16

Powder X-ray diffraction with Rietveld refinement

X-ray diffraction and scattering

Ni SAs@UiO-66-NH2(Hf) powder · Powder

PXRD using Cu Kalpha radiation; compared UiO-66, UiO-66-NH2 and Ni SAs@UiO-66-NH2.

Geometry
powder
Context
Target sample compared with pristine UiO-66 and amino-functionalised controls.
Measurement source
3 · Structure and Morphology · Figure 1c and Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Rietveld-refined Ni SAs@UiO-66-NH2 lattice parameters and cell volumeP1; a=14.769 A, b=14.780 A, c=14.767 A, alpha=60.034 deg, beta=60.002 deg, gamma=59.934 deg, V=2175.135 A3——SI Table
Exact Reported		32 · Supplementary Tables · Table S1
Rietveld-refined UiO-66-NH2 lattice parameters and cell volumeMarked as a best value within this paperP1; a=14.769 A, b=14.790 A, c=14.789 A, alpha=59.998 deg, beta=60.043 deg, gamma=60.048 deg, V=2285.563 A3——SI Table
Exact Reported		32 · Supplementary Tables · Table S1
Rietveld-refined UiO-66 lattice parameters and cell volumeP1; a=14.537 A, b=14.558 A, c=14.616 A, alpha=60.288 deg, beta=59.552 deg, gamma=59.454 deg, V=2278.804 A3——SI Table
Exact Reported		32 · Supplementary Tables · Table S1
UiO-66 framework retained after amino functionalisation and Ni incorporationAll three samples retain the characteristic UiO-66 crystalline framework; no Ni or NiO diffraction peaks observed.——Text
Qualitative		3 · Structure and Morphology · Figure 1c and Table S1